Micro-Optical Back Reflection Diagnostics With Simple Test Optics

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Solution Overview

Problem

Current methods for diagnosing photonic devices at the micrometer scale are costly and require substantial equipment, making them inefficient for micro-optical components.

Innovation Solution

An apparatus and method using a receiver, light source, coupler, and power meter to measure optical back reflection from micro-optical components, with a comparative database for diagnostics.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If image forming or interferometry methods are used to diagnose photonic devices, then diagnostic accuracy is improved, but equipment complexity and cost increase substantially

Engineering Contradiction:
Improvediagnostic accuracyVSAvoidequipment complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The patent extracts only the essential diagnostic function from complex interferometry systems by using a simplified optical back reflection measurement approach. Instead of employing full interferometry equipment, the invention uses a basic light source, optical path through the device under test, and detector to measure back reflection, achieving diagnostic capability with minimal equipment while maintaining the ability to detect device characteristics

Inventive Principle:
Principle #2Taking out (Extraction)

Solution Approach 2:

The patent replaces expensive, sophisticated diagnostic equipment with simple, inexpensive optical components. The measurement system uses basic elements (light source, optical path, detector) rather than costly interferometry equipment, making the diagnostic process affordable and accessible for micro-optical component testing

Inventive Principle:
Principle #27Cheap short-living objects (Disposable)

2Measurement precision

If image forming or interferometry methods are used to diagnose photonic devices, then diagnostic accuracy is improved, but testing area requirements increase

Engineering Contradiction:
Improvediagnostic accuracyVSAvoidtesting area
Core Design Contradiction:
Measurement precisionVSArea of stationary object

Solution Approach 1:

The patent merges the light source, optical path, and detector into a compact integrated measurement system. The optical path passes directly through the device under test in a linear configuration, combining multiple functions into a small footprint that requires minimal testing area while maintaining diagnostic capability

Inventive Principle:
Principle #5Merging (Combining)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

Provides efficient and cost-effective diagnostics for micro-optical components by analyzing back reflection patterns for component integrity and discontinuities.

Implementation Method 1

a coupler for passing aspects of light from the light source through the micro optical component system to a termination, and for passing remaining aspects from the light source back reflected from the micro optical component system to a power meter

Methodology Applied
Scientific EffectOptical back reflection: Reflection

Data Source

PatentUS12607540B2Optical back reflection diagnostics for micro optical components
Publication Date: 2026.04.21 JABIL INC
  • US12607540B2 patent drawing
  • US12607540B2 patent drawing
  • US12607540B2 patent drawing

AI summary

An apparatus, system and method for testing a micro-optical component system. The apparatus, system and method may include a receiver for receiving the micro optical component system; a light source; and a coupler for passing aspects of light from the light source through the micro optical component system to a termination, and for passing remaining aspects from the light source back reflected from the micro optical component system to a power meter. A reading at the power meter of the back reflection may correspond to a diagnosis of the micro optical component system.