Micro-Sampling Tool for Intact Multi-Layer Surface Removal

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Solution Overview

Problem

Existing methods for assessing the integrity and characterizing multi-layered structures, such as nuclear fuel cladding, are costly and disruptive, requiring the removal and shipment of entire components for analysis, with only a small portion being usable, and are not feasible for critical components in operation.

Innovation Solution

A minimally invasive method for micro-sampling that preserves the integrity of surface deposits and coatings by penetrating the top surface to a predetermined depth, using tools like micro-diamond wire saws, micro-focus lasers, or end mills, to extract a small sample without cutting through the base, which can then be analyzed using electron microscopy.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If entire fuel rods are removed and shipped to specialized facilities for characterization, then complete analysis of cladding integrity is achieved, but costs exceed one million dollars and operational disruption occurs

Engineering Contradiction:
Improvecladding characterization completenessVSAvoidamount of material requiring shipment
Core Design Contradiction:
Measurement precisionVSQuantity of substance

Solution Approach 1:

The patent extracts only the necessary micro-sample (e.g., 1mm diameter cross-section) containing the multi-layered structure of interest from the entire fuel rod, rather than shipping the complete fuel rod. This extraction principle reduces the quantity of material requiring shipment and associated costs while maintaining the ability to perform complete characterization of the cladding and coating layers.

Inventive Principle:
Principle #2Taking out (Extraction)

Solution Approach 2:

The patent segments the fuel rod into a manageable micro-sample that contains the specific multi-layered structure (cladding, coating layers, oxidation layers, deposits) requiring analysis. This segmentation allows the sample to be handled, shipped, and analyzed using conventional facilities rather than requiring specialized hot cell facilities, thereby reducing costs and operational disruption.

Inventive Principle:
Principle #1Segmentation

2Quantity of substance

If kilograms of samples are removed from critical components, then sufficient material for analysis is obtained, but operational shutdown is required and only micrograms to nanograms are actually analyzed

Engineering Contradiction:
Improvesample mass for analysisVSAvoidoperational continuity
Core Design Contradiction:
Quantity of substanceVSProductivity

Solution Approach 1:

The patent extracts a precise micro-sample containing the multi-layered structure of interest without requiring removal of large quantities of material or shutdown of operations. The micro-sample (e.g., 1mm diameter) is sufficient for complete characterization using electron microscopy and other analytical techniques, thereby maintaining operational continuity while obtaining adequate sample mass for analysis.

Inventive Principle:
Principle #2Taking out (Extraction)

Solution Approach 2:

The patent applies partial action by removing only the minimum necessary sample (micro-sample) rather than kilograms of material. This partial removal is sufficient for complete analysis of the multi-layered structure, avoiding the need for operational shutdown and minimizing material loss while ensuring adequate sample quantity for comprehensive characterization.

Inventive Principle:
Principle #16Partial or excessive action

3Stability of the object's composition

If micro-cutting tools penetrate to predetermined depth without cutting through the base, then intact multi-layered samples are preserved, but sampling precision requirements increase

Engineering Contradiction:
Improveintegrity of multi-layered structureVSAvoidpenetration depth control
Core Design Contradiction:
Stability of the object's compositionVSManufacturing precision

Solution Approach 1:

The patent applies preliminary action by designing the micro-cutting tool with a predetermined depth stop or限位 mechanism before the cutting operation begins. This preliminary depth limitation ensures that the tool penetrates only to the required depth (sufficient to include each layer of the multi-layered material and a portion of the base) without cutting through the full depth of the base, thereby preserving the integrity of the multi-layered structure while controlling penetration precision.

Inventive Principle:
Principle #10Preliminary action

Solution Approach 2:

The patent applies local quality by concentrating the cutting action only in the specific region where the multi-layered structure is located, with the depth controlled to match the thickness of the coating layers and oxidation layers plus a portion of the base. This localized precision cutting preserves the integrity of the multi-layered structure while avoiding unnecessary removal of base material, thereby maintaining composition stability with controlled precision.

Inventive Principle:
Principle #3Local quality

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

Reduces costs and minimizes disruption by allowing small, intact samples to be analyzed, improving data quality and reducing the need for costly mobilization and shipment of radioactive materials.

Implementation Method 1

penetrating a top surface of the material with a micro-cutting tool

Methodology Applied
Scientific EffectAbrasion: Abrasion

Implementation Method 2

penetrating a top surface of the material with a micro-cutting tool

Methodology Applied
Scientific EffectLaser ablation: Laser Ablation

Data Source

PatentUS12360016B2Minimally invasive microsampler for intact removal of surface deposits and substrates
Publication Date: 2025.07.15 WESTINGHOUSE ELECTRIC CORP
  • US12360016B2 patent drawing
  • US12360016B2 patent drawing
  • US12360016B2 patent drawing

AI summary

A method of sampling a multi-layered material and a micro-sampling tool are described. The sampling method includes penetrating a top surface of a material in a component of interest with a micro-cutting tool to a predetermined depth sufficient to include each layer of the multi-layered material and a portion of the base, without cutting through the full depth of the base, under-cutting from the depth of penetration through the base to define a micro-sample of the multi-layered material, and removing the micro-sample with each layer of the multi-layered material intact. The micro-sampler includes a cutting tool calibrated to cut to a depth no greater than 2 mm, and in some aspects, no greater than 200 microns into a multi-layered material, the material having a top surface and a metallic or ceramic base and a container for removing and storing a micro-sample cut from the material with each layer of the multi-layered material and a portion of the base intact.