Microchip Surface Projections for Agent Inspection
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Solution Overview
Problem
Existing microchips face challenges in accurately inspecting the state of application of surface processing agents without using fluorescent dyes, which can cause fluorescence interference and hinder optical measurements, and may also affect chemical reactions or elute into reagents, leading to inaccurate results.
Innovation Solution
A microchip design featuring small projections of 0.5 to 30 μm in height on the substrate surface allows for the inspection of surface processing agent application and removal using white light, eliminating the need for fluorescent dyes by observing luminance changes in diffused reflection, thereby ensuring accurate optical measurements and preventing interference with chemical reactions.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Difficulty of detecting and measuring
If fluorescent dye is introduced to the liquid material for inspection, then the state of application can be detected, but fluorescence interference occurs during optical measurement
Solution Approach 1:
The patent extracts and removes the fluorescent dye from the liquid material formulation, replacing it with alternative inspection methods that do not rely on fluorescent additives. This eliminates the source of fluorescence interference while maintaining the ability to detect application state through other means such as visual inspection or alternative detection techniques.
Solution Approach 2:
The patent introduces an intermediary substance or method that enables inspection without using fluorescent dyes. This could involve using a different detection mechanism or intermediary material that provides contrast or visibility for inspection purposes without generating fluorescence interference during subsequent optical measurements.
2Difficulty of detecting and measuring
If fluorescent dye is added to the surface processing agent, then application state can be inspected, but chemical reactions are hindered and measurement accuracy decreases
Solution Approach 1:
The patent removes fluorescent dyes from the surface processing agent formulation entirely. Instead, it employs inspection methods that do not require chemical additives, such as visual inspection under appropriate lighting, optical microscopy, or other non-invasive detection techniques that maintain both reaction integrity and measurement accuracy.
Solution Approach 2:
The patent may employ disposable inspection methods or single-use detection techniques that do not leave residual contaminants in the system. This ensures that no fluorescent dye residues remain to interfere with subsequent chemical reactions or optical measurements, maintaining precision without requiring complex removal processes.
3Difficulty of detecting and measuring
If fluorescent dye is used in the coating agent, then application inspection is enabled, but the dye may elute into reagents causing inaccurate results
Solution Approach 1:
The patent extracts and eliminates fluorescent dyes from the coating agent formulation. It replaces fluorescent inspection methods with alternative techniques such as visual inspection, optical detection without fluorescent markers, or physical inspection methods that do not involve chemical additives, thereby preventing elution into reagents and maintaining result reliability.
Solution Approach 2:
The patent introduces an intermediary inspection method that provides application verification without using fluorescent chemicals. This intermediary approach uses physical or optical detection techniques that do not involve substances that could elute into the reagent system, ensuring that measurement reliability is maintained throughout the process.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This method enhances manufacturing efficiency by simplifying the inspection process, prevents fluorescence interference, and ensures highly accurate optical measurements without compromising chemical reactions or reagent integrity.
Implementation Method 1
observing luminance changes in diffused reflection
Data Source
AI summary
A microchip formed by joining a first substrate having at least one recess on its surface and a second substrate, wherein small projections of 0.5 to 30 μm in height are formed on at least a part of the surface having the recess of the first substrate, and a coating formed of a surface processing agent is provided on at least a part of the surface having the small projections formed thereon, as well as a method of manufacturing the microchip, are provided. A microchip allowing easy inspection of the state of application or state of adhesion of liquid material such as a surface processing agent, and allowing accurate optical measurement without causing disturbance such as fluorescence, can be provided.