Microcrystal Structure Analysis Device with Rotational X-ray Shielding
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Solution Overview
Problem
Conventional X-ray structure analysis methods using pseudo-single-crystallized microcrystals face challenges in obtaining favorable diffraction images due to medium curing issues and continuous X-ray application during sample rotation, which disrupts crystal orientation and limits X-ray application to specific rotational positions.
Innovation Solution
A microcrystal structure analysis apparatus and method that uses a rotating sample with a magnetic field to orient microcrystals pseudo-single-crystallized, applying X-rays intermittently by switching an X-ray shielding device to allow detection only when specific parts are aligned, ensuring favorable diffraction images are obtained.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Productivity
If X-rays are continuously applied to the pseudo-single-crystallized sample while the sample is rotated, then the analysis can be performed without stopping rotation, but a favorable X-ray diffraction image cannot be obtained
Solution Approach 1:
The patent applies periodic action by intermittently applying X-rays to the rotating sample. The X-ray application is synchronized with the rotational position of the sample, enabling X-ray exposure only during specific angular positions where favorable diffraction images can be obtained. This periodic on-off cycle of X-ray application resolves the contradiction by maintaining continuous rotation (productivity) while ensuring high-quality diffraction images are captured at optimal moments.
2Stability of the object's composition
If the suspending medium is cured to fix the orientation of the microcrystals, then the orientation is stabilized, but the microcrystals cannot be collected after analysis and the orientation is disturbed by contraction
Solution Approach 1:
The patent extracts the microcrystals from the cured suspending medium through filtration or centrifugation processes. By separating the microcrystals from the cured medium that provided orientation stability during analysis, the invention enables both stable orientation during measurement and subsequent collection/recycling of the valuable microcrystal samples for further use.
3Stability of the object's composition
If the suspending medium is cured with ultraviolet rays to fix the orientation, then the orientation is fixed, but the medium contracts and disturbs the microcrystal orientation
Solution Approach 1:
The patent removes the cured suspending medium after it has served its purpose of maintaining orientation during X-ray analysis. By extracting the microcrystals from the cured medium before final measurement or through careful timing of the curing process, the invention prevents the contraction of the cured medium from disturbing the microcrystal orientation, while still benefiting from the temporary stabilization during the analysis setup.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach enables the acquisition of favorable X-ray diffraction images even when X-rays are applied to pseudo-single-crystallized samples during rotation, improving image quality and reducing orientation disturbances.
Implementation Method 1
a temporally varying magnetic field is applied to a sample having microcrystals suspended therein to three-dimensionally orient (pseudo-single-crystallize) the microcrystals
Implementation Method 2
rotating a sample having microcrystals suspended therein relative to the magnetic field generation unit such that a temporally varying magnetic field is applied to the sample to three-dimensionally orient the microcrystals
Implementation Method 3
the X rays that have passed through and have been diffracted by the sample are detected, whereby it is possible to obtain an X-ray diffraction image of the pseudo-single crystals
Data Source
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AI summary
A microcrystal structure analysis apparatus, a microcrystal structure analysis method, and an X-ray shielding device are provided which allow a favorable X-ray diffraction image to be obtained even when X rays are applied to a pseudo-single-crystallized sample while the sample is rotated. A microcrystal structure analysis apparatus 1 of the present invention includes: a magnetic field generation unit 12; a sample drive unit 13 configured to rotate a sample container 2 containing a sample having microcrystals 3 suspended therein relative to the magnetic field generation unit 12 such that a temporally varying magnetic field is applied to the sample container 2 to three-dimensionally orient the microcrystals 3; an X-ray source 21 configured to apply X rays a to the sample container 2 that is being rotated by the sample drive unit 13; an X-ray detection unit 23 capable of detecting the X rays a that have passed through and have been diffracted by the sample container 2; and a state switching device G configured to cause a state where detection of the X rays a by the X-ray detection unit 23 is disenabled or a state where detection of the X rays a by the X-ray detection unit 23 is enabled, in accordance with a rotational position of a specific part 2a which is a part of the sample container 2 in a rotation direction thereof.