Microdevice Cartridge Mapping for Adjacent Parameter Uniformity

Resolve Bottlenecks,
Find Innovative Solutions
Generate Solutions

Solution Overview

Problem

Existing methods for populating system substrates with micro devices fail to account for parameter variations among adjacent devices, leading to inconsistencies and non-uniformity, particularly in parameters such as color point and performance.

Innovation Solution

A method involving binning and compensation of micro devices based on parameter thresholds and distribution maps to ensure uniformity across the system substrate, utilizing cartridge parameters to adjust device characteristics like color point and performance.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Productivity

If micro devices are populated from different cartridges without parameter matching, then productivity is improved, but manufacturing precision deteriorates due to parameter variations between adjacent devices

Engineering Contradiction:
Improvepopulation speedVSAvoidparameter uniformity
Core Design Contradiction:
ProductivityVSManufacturing precision

Solution Approach 1:

The patent applies preliminary action by extracting and storing parameters for each micro device in every cartridge before the population process. This pre-extraction allows the system to plan the population sequence in advance, ensuring that devices with similar parameters are placed in adjacent locations on the system substrate, thereby maintaining manufacturing precision while enabling high-speed population from multiple cartridges.

Inventive Principle:
Principle #10Preliminary action

Solution Approach 2:

The patent utilizes parameter changes by creating a distribution map that tracks parameters across all cartridges and dynamically determining the optimal population sequence based on parameter similarity. The system adjusts the population plan according to parameter values, selecting devices from different cartridges in an order that minimizes parameter variations between adjacent devices on the system substrate.

Inventive Principle:
Principle #35Parameter changes

2Manufacturing precision

If parameter extraction and matching is performed for all micro devices, then manufacturing precision is improved, but device complexity increases due to additional processing steps

Engineering Contradiction:
Improveparameter matching accuracyVSAvoidprocessing complexity
Core Design Contradiction:
Manufacturing precisionVSDevice complexity

Solution Approach 1:

The patent applies local quality by focusing parameter extraction and matching only on the local level of individual cartridges and their immediate impact on the system substrate. Instead of globally optimizing all devices at once, the system processes each cartridge locally, creating distribution maps that guide the placement of devices from that specific cartridge, thereby reducing overall processing complexity while maintaining precision.

Inventive Principle:
Principle #3Local quality

Solution Approach 2:

The patent segments the population process into discrete steps: extracting parameters for each cartridge separately, creating individual distribution maps for each cartridge, and then integrating these segmented plans into a coordinated population sequence. This segmentation reduces the complexity of handling all devices simultaneously while ensuring parameter matching accuracy through systematic processing of smaller groups.

Inventive Principle:
Principle #1Segmentation

Data Source

PatentUS12512040B2Microdevice cartridge mapping and compensation
Publication Date: 2025.12.30 VUEREAL INC
  • US12512040B2 patent drawing
  • US12512040B2 patent drawing
  • US12512040B2 patent drawing

AI summary

This disclosure is related to compensation of micro devices based on cartridge information.