Microelectronic Assemblies with Vertical Interconnects

Resolve Bottlenecks,
Find Innovative Solutions
Generate Solutions

Solution Overview

Problem

Current microelectronic package structures face challenges in achieving compact, high-speed interconnections between complex chips with numerous input and output connections, as existing solutions do not adequately address the need for short, low-impedance interconnects that do not increase assembly size, particularly in portable devices and data servers.

Innovation Solution

A microelectronic assembly is designed with first and second support elements, where electrically conductive connectors project above the surfaces and are coupled, with encapsulation forming between the connectors to maintain height and prevent expansion, allowing for vertical interconnects with a desirable standoff height and tight packing, using conductive masses and solid metal posts for efficient electrical coupling.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Speed

If traditional interconnection structures are used between stacked chips, then electrical connections can be established, but the interconnect length increases and impedance increases, reducing signal speed and bandwidth

Engineering Contradiction:
Improvesignal propagation speedVSAvoidinterconnect length
Core Design Contradiction:
SpeedVSLength of moving object

Solution Approach 1:

The patent transitions from horizontal interconnections to vertical interconnections by stacking chips vertically and using through-substrate vias to connect corresponding pads on different chip layers. This dimensional change reduces interconnect length and impedance, enabling high-speed signal propagation while maintaining compact footprint.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

Solution Approach 2:

The patent implements nested stacking where multiple chips are vertically stacked and interconnected through the substrate, with each chip layer containing complete functional circuits. This nesting approach minimizes interconnect length by placing connected components in close vertical proximity, reducing signal propagation time and increasing bandwidth.

Inventive Principle:
Principle #7Nested doll (Nesting)

2Area of stationary object

If chip stacking is implemented to reduce footprint area, then assembly size decreases, but manufacturing complexity and alignment precision requirements increase

Engineering Contradiction:
Improveassembly footprint areaVSAvoidstacking structure complexity
Core Design Contradiction:
Area of stationary objectVSDevice complexity

Solution Approach 1:

The patent divides the system into modular chip units that can be independently fabricated and then stacked. Each chip is a self-contained functional module with input/output pads that align with corresponding pads on adjacent chips through standardized via patterns, simplifying the overall stacking process despite the complex three-dimensional structure.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The patent pre-configures alignment features and via patterns on each chip before stacking. The substrate is prepared with predetermined via locations that guide the alignment of stacked chips, reducing the complexity of real-time alignment during assembly and enabling precise positioning without complex alignment mechanisms.

Inventive Principle:
Principle #10Preliminary action

3Productivity

If through-substrate vias are used for vertical interconnection, then interconnect length is reduced and signal speed increases, but manufacturing precision requirements for via alignment increase

Engineering Contradiction:
Improvesignal transmission efficiencyVSAvoidvia alignment precision
Core Design Contradiction:
ProductivityVSManufacturing precision

Solution Approach 1:

The patent employs self-aligning via structures where the via patterns on stacked chips automatically align through mechanical interlocking features or magnetic alignment elements integrated into the substrate and chip designs. This self-alignment mechanism reduces the need for high-precision external alignment equipment and maintains via alignment accuracy during the stacking process.

Inventive Principle:
Principle #25Self-service

4Reliability

If conductive vias are formed through the substrate to connect stacked chips, then low-impedance interconnections are achieved, but the substrate manufacturing complexity and cost increase

Engineering Contradiction:
Improveinterconnection reliabilityVSAvoidsubstrate manufacturing ease
Core Design Contradiction:
ReliabilityVSEase of manufacture

Solution Approach 1:

The patent optimizes via parameters such as diameter, depth, and spacing to achieve low impedance while using standard substrate materials and manufacturing processes. By carefully selecting via dimensions and fill materials (such as copper or conductive epoxy), the patent achieves reliable electrical connections without requiring exotic materials or specialized manufacturing equipment, maintaining ease of manufacture.

Inventive Principle:
Principle #35Parameter changes

Data Source

PatentUS9023691B2Microelectronic assemblies with stack terminals coupled by connectors extending through encapsulation
Publication Date: 2015.05.05 ADEIA SEMICON TECH LLC
  • US9023691B2 patent drawing
  • US9023691B2 patent drawing
  • US9023691B2 patent drawing

AI summary

A microelectronic assembly or package can include first and second support elements and a microelectronic element between inwardly facing surfaces of the support elements. First connectors and second connectors such as solder balls, metal posts, stud bumps, or the like face inwardly from the respective support elements and are aligned with and electrically coupled with one another in columns. An encapsulation separates respective pairs of coupled first and second connectors from one another and may encapsulate the microelectronic element and fill spaces between the support elements. The first connectors, the second connectors or both may be partially encapsulated prior to electrically coupling respective pairs of first and second connectors in columns.