Microlayer Optical Stack for Fluorescence Signal Detection
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Solution Overview
Problem
Conventional fluorescence-based optical detection devices suffer from underutilization of excitation light and inefficient collection and detection of emitted light, leading to reduced signal generation and optical distortion, which hampers precise sensing and imaging of analytes.
Innovation Solution
An optical stack comprising first and second optical filters with multiple microlayers, each less than 500 nm thick, is used to maximize absorption and reuse of incident light by the test material while efficiently collecting and detecting emitted light, minimizing optical distortion.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Productivity
If conventional fluorescence-based optical detection devices are used, then the device structure is simple, but the excitation light is underutilized and emitted light collection is inefficient
Solution Approach 1:
The optical filter is divided into multiple microlayers (at least 5 layers) with each layer having a specific thickness (less than 500 nm). This segmentation allows for optimized light interaction at each interface, improving both excitation light absorption and emitted light collection efficiency.
Solution Approach 2:
The patent transitions from conventional single-layer or few-layer optical filters to a multi-layer microlayer structure. This dimensional change in the optical path enables enhanced light management through multiple reflection and transmission interfaces, resolving the contradiction between simple structure and high efficiency.
2Measurement precision
If conventional optical filters are used, then the device complexity is low, but optical distortion and scattering occur
Solution Approach 1:
The optical filter is segmented into multiple thin microlayers, each contributing to reduced optical distortion and scattering. This segmented structure improves measurement precision by minimizing light degradation while maintaining a manageable device complexity through standardized layer repetition.
Solution Approach 2:
The patent changes the critical parameter of layer thickness to less than 500 nm per layer, which fundamentally alters the optical interaction characteristics. This parameter change reduces optical distortion and scattering effects, improving sensing accuracy despite the increased number of layers.
3Productivity
If thick optical filter layers are used, then manufacturing is easier, but light absorption and detection efficiency decrease
Solution Approach 1:
Instead of manufacturing one thick filter layer, the system uses multiple thin microlayers (each <500 nm). This segmentation improves light detection efficiency through enhanced optical interaction while the repetitive nature of thin layers makes the manufacturing process more controllable and precise.
Solution Approach 2:
The layer thickness parameter is reduced to less than 500 nm, which fundamentally changes the manufacturing approach from thick-film deposition to thin-film deposition techniques. This parameter change enables better optical performance while utilizing established thin-film fabrication methods.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The optical stack enhances the signal-to-noise ratio and enables accurate sensing and imaging of analytes by maximizing incident light absorption and emitted light detection, reducing optical distortion and scattering.
Implementation Method 1
a sensor material configured to emit an emitted light having a second wavelength when irradiated with an incident light having a different first wavelength
Implementation Method 2
The first optical film includes a plurality of microlayers numbering at least 5 in total. Each of the microlayers has an average thickness of less than about 500 nm. For a same incident angle, the first optical film has first and second optical transmittances at the respective first and second wavelengths.
Data Source
AI summary
An optical stack for sensing a presence of an analyte is provided. The optical stack includes a sensor material. The sensor material includes a first optical response including a first optical property having a second value in response to an excitation signal including the first optical property having a first value different from the second value. The first optical response includes a second optical property sensitive to the presence of the analyte. The optical stack includes a first optical film disposed proximate the sensor material and includes a third optical property having respective third and fourth values in response to the respective first and second values of the first optical property. The third value is different from the fourth value by at least a factor of 2.