Micro-LED Subpixel Repair Using Defect Mapping and Color Conversion
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Solution Overview
Problem
Micro LED displays face challenges in repairing defective micro devices transferred to the system substrate, which affects yield and increases costs due to the need for spare micro devices.
Innovation Solution
The implementation of a display system with a defect mapping block that maps data from defective sub-pixels to surrounding spare sub-pixels, along with methods such as color conversion or color filtering to match the color of defective sub-pixels with spare sub-pixels, and periodic spatial variation of sub-pixel positions to minimize visual artifacts.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Productivity
If spare micro devices are used to replace defective ones, then yield is improved, but cost increases
Solution Approach 1:
The patent creates a virtual copy of the defective sub-pixel by mapping its data to surrounding spare sub-pixels. Instead of physically replacing the defective micro-device, the system creates a digital replica of the sub-pixel's function by redistributing its data to neighboring spare sub-pixels, thereby maintaining display functionality without incurring the cost of additional physical components
Solution Approach 2:
The spare sub-pixels are designed to serve multiple functions: they act as normal display elements during regular operation and simultaneously serve as replacement elements when defects occur. This multi-functionality allows the same physical components to fulfill both display and repair roles, eliminating the need for dedicated spare micro-devices
2Productivity
If repair processes are made easier and more practical, then yield increases, but manufacturing complexity may increase
Solution Approach 1:
The system pre-identifies and designates spare sub-pixels during the manufacturing process, before defects occur. The defect mapping block is pre-configured with knowledge of which sub-pixels are spares and how to map defective sub-pixel data to them. This preliminary preparation enables rapid defect compensation without complex real-time decision-making or additional manufacturing steps
Solution Approach 2:
The defect mapping block serves as an intermediary component that bridges defective sub-pixels and spare sub-pixels. It automatically handles the complex task of data redistribution and color matching, shielding the manufacturing process from complexity while enabling yield improvement through automated defect compensation
3Reliability
If color conversion or color filtering is applied to match spare sub-pixel colors, then repair effectiveness is improved, but device complexity increases
Solution Approach 1:
The patent changes the optical parameters of spare sub-pixels by applying color conversion materials or color filters. This modifies the emission wavelength or color output of spare sub-pixels to match the defective sub-pixel's characteristics, enabling effective color matching without requiring physical replacement of the micro-device
Solution Approach 2:
The system utilizes color conversion and color filtering techniques to transform the color output of spare sub-pixels. By applying quantum dots, phosphors, or color filters, the spare sub-pixels can emit the same color as the defective sub-pixel, achieving visual matching and effective repair while avoiding complex physical replacement procedures
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach enables efficient repair of defective sub-pixels in micro LED displays, increasing yield while reducing costs by effectively utilizing spare sub-pixels and improving the light output profile of solid state array devices.
Implementation Method 1
converting the spare sub-pixel with a color conversion or color filter to create a color same as that of the defected sub-pixel
Implementation Method 2
applying a color filter material to at least one of the primary sub-pixels to convert the combined-wavelength emission into a different emission wavelength
Data Source
AI summary
What is disclosed are structures and methods for repairing emissive display systems. Various repairing techniques embodiments in accordance with the structures and methods are provided to conquer and mitigate the defected pixels and to increase the yield and reduce the cost of emissive displays systems.