Micro-LED Semiconductor Reflector for Light Extraction

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Solution Overview

Problem

Conventional Micro-LED devices face challenges in manufacturing Ohmic contact layers with reduced areas for efficient light extraction, leading to absorption issues and reduced light emission efficiency.

Innovation Solution

Incorporating a semiconductor reflector between the light emitting layer and the n-type contact layer, along with a first insulating layer with a refractive index different from the p-type semiconductor layer, to prevent light absorption and enhance light emission efficiency, and using a distributed Bragg reflector with alternating layers to redirect light and reduce total internal reflection.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Loss of energy

If the Ohmic contact layer area is reduced to minimize light absorption, then light extraction efficiency is improved, but manufacturing difficulty increases for Micro-LEDs

Engineering Contradiction:
Improvelight absorption lossVSAvoidmanufacturing difficulty of Ohmic contact layer
Core Design Contradiction:
Loss of energyVSEase of manufacture

Solution Approach 1:

The patent introduces a semiconductor reflector layer as an intermediary component between the light emitting layer and the n-type contact layer. This reflector prevents light generated in the light emitting layer from being absorbed by the contact layer, thereby reducing light absorption loss without requiring reduction of the contact layer area, thus maintaining ease of manufacture while improving light extraction efficiency

Inventive Principle:
Principle #24Intermediary (Mediator)

Solution Approach 2:

The patent extracts the light reflection function from the contact layer system by introducing a dedicated semiconductor reflector layer. This separate component specifically addresses light absorption loss without affecting the contact layer's electrical function or area requirements, resolving the manufacturing difficulty while achieving energy loss reduction

Inventive Principle:
Principle #2Taking out (Extraction)

2Loss of energy

If a semiconductor reflector is added to prevent light absorption, then light emission efficiency is enhanced, but device complexity increases

Engineering Contradiction:
Improvelight emission efficiencyVSAvoidstructural complexity
Core Design Contradiction:
Loss of energyVSDevice complexity

Solution Approach 1:

The semiconductor reflector layer is designed with specific material composition parameters (AlGaInP with varying Al content) and thickness parameters (50-200 nm) that enable it to achieve the desired light reflection function. By optimizing these parameters, the reflector provides effective light emission efficiency enhancement while maintaining a simple single-layer structure that does not significantly increase device complexity

Inventive Principle:
Principle #35Parameter changes

3Loss of energy

If the top surface of p-type semiconductor layer is made rough to reduce total internal reflection, then light extraction efficiency is improved, but manufacturing precision requirements increase

Engineering Contradiction:
Improvetotal internal reflection lossVSAvoidsurface roughness control
Core Design Contradiction:
Loss of energyVSManufacturing precision

Solution Approach 1:

The patent employs a self-service approach by using the same spin coating process that forms the insulating layer to simultaneously create the rough surface structure. The inherent variations in spin coating naturally produce the desired surface roughness without requiring additional precision manufacturing steps, thus improving light extraction efficiency while maintaining reasonable manufacturing precision requirements

Inventive Principle:
Principle #25Self-service

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The solution significantly enhances light emission and extraction efficiency by preventing light absorption and minimizing losses due to total internal reflection, resulting in improved performance for Micro-LED devices.

Implementation Method 1

a semiconductor reflector between the light emitting layer and the n-type contact layer so as to prevent the n-type contact layer from absorbing light which is generated in the light emitting layer

Methodology Applied
Scientific EffectLight reflection: Reflection

Implementation Method 2

a first insulating layer having a refractive index different from a refractive index of the p-type semiconductor layer

Methodology Applied
Scientific EffectRefraction: Refraction

Implementation Method 3

improved light extraction efficiency can be provided for the light emitting device because of reducing loss due to total internal reflection between air and the top surface of the p-type semiconductor layer

Methodology Applied
Scientific EffectTotal internal reflection: Total Internal Reflection

Data Source

PatentUS10971650B2Light emitting device
Publication Date: 2021.04.06 ENNOSTAR CORP
  • US10971650B2 patent drawing
  • US10971650B2 patent drawing
  • US10971650B2 patent drawing

AI summary

A light emitting device includes a stacked structure and a first insulating layer covering at least side surfaces of the stacked structure including a p-type and n-type semiconductor layers, a light emitting layer sandwiched between the p-type and n-type semiconductor layers, an n-type electrode on the n-type semiconductor layer, an n-type contact layer sandwiched between the n-type semiconductor layer and the n-type electrode, a p-type electrode on the p-type semiconductor layer, an n-type contact pad on the n-type electrode, a p-type contact pad on the p-type electrode, and a semiconductor reflector between the light emitting layer and the n-type contact layer including multiple periods, each period including at least a first layer and at least a second layer having a refractive index different from a refractive index of the first layer. The light emitting device could be applied to wide color gamut (WCG) backlight modules or ultra-thin backlight modules.