Micromechanical Sensor Self-Test Interference Rejection

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Solution Overview

Problem

Micromechanical sensors face challenges in obtaining robust self-test results due to susceptibility to external interferences, especially in sensitive sensors with limited computation resources, leading to unreliable evaluations and the avoidance of self-tests in high-interference environments.

Innovation Solution

The method involves comparing and correlating the results of at least two successive self-tests using varied frequencies or periods, evaluating derived variables such as mean values of response signals, to enhance the stability of self-test evaluations and reduce interference sensitivity, while minimizing resource usage in both the sensor and controller.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Device complexity

If self-test is performed using a constant time grid, then the self-test sequence is simple and easy to implement, but the sensor becomes highly susceptible to interference signals at corresponding frequencies

Engineering Contradiction:
Improveself-test sequence complexityVSAvoidinterference signal susceptibility
Core Design Contradiction:
Device complexityVSObject-affected harmful factors

Solution Approach 1:

The patent applies dynamics by varying the time grid parameters (periods and/or frequencies) between successive self-test sequences. Instead of using a constant time grid, the system dynamically adjusts the timing characteristics of each self-test sequence, making the interference pattern unpredictable and preventing consistent interference at specific frequencies while maintaining implementation simplicity.

Inventive Principle:
Principle #15Dynamics

2Reliability

If multiple self-tests are performed with varied frequencies, then robustness against interference is improved, but computation resources are increased

Engineering Contradiction:
Improveself-test result robustnessVSAvoidcomputation resource usage
Core Design Contradiction:
ReliabilityVSUse of energy by moving object

Solution Approach 1:

The patent applies parameter changes by systematically varying time grid parameters (periods and frequencies) across multiple self-test sequences. This approach achieves robustness against interference through parameter diversity while maintaining computational efficiency by using simple, predictable variation patterns that can be implemented with minimal processing overhead.

Inventive Principle:
Principle #35Parameter changes

3Use of energy by moving object

If self-test is performed in sensitive sensors with limited computation resources, then resource usage is minimized, but the ability to handle external interferences is reduced

Engineering Contradiction:
Improvecomputation resource usageVSAvoidexternal interference susceptibility
Core Design Contradiction:
Use of energy by moving objectVSObject-affected harmful factors

Solution Approach 1:

The patent applies periodic action by performing multiple self-test sequences with systematically varied time grid parameters. The periodic repetition of self-tests with different timing characteristics allows the system to average out interference effects over time, achieving robustness in resource-constrained sensors without requiring complex computation algorithms.

Inventive Principle:
Principle #19Periodic action

Data Source

PatentUS8316688B2Method for carrying out a self-test for a micromechanical sensor device, and corresponding micromechanical sensor device
Publication Date: 2012.11.27 ROBERT BOSCH GMBH
  • US8316688B2 patent drawing
  • US8316688B2 patent drawing
  • US8316688B2 patent drawing

AI summary

A method for carrying out a self-test for a micromechanical sensor device, and a corresponding micromechanical sensor device. The method has the following steps: exciting the sensor device using a first excitation signal variation in a first self-test; storing a corresponding first response signal variation of the sensor device; exciting the sensor device using a second excitation signal variation in a second self-test; storing a corresponding second response signal variation of the sensor device; analyzing the first and second response signal variations with regard to at least one predefined criterion; and preparing a self-test result based on the analytical result of the first and second response signal variations.