Micrometer Strain Gauge Frame Deformation Compensation
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Solution Overview
Problem
Micrometers with constant pressure devices face measurement errors due to varying measurement forces and frame deformations, leading to reduced repeatability when the attitude changes from zero-set to measurement positions.
Innovation Solution
Incorporating a deformation detecting section, such as a strain gauge, to measure frame deformations at zero-set and measurement times, and using a compensator to adjust detection values based on stored compensation factors, allowing for real-time compensation of measurement errors without external devices.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Stability of the object's composition
If a constant pressure device is used to stabilize measurement force, then measurement force stability is improved, but measurement precision deteriorates when attitude changes from zero-set to measurement positions
Solution Approach 1:
The patent applies preliminary action by detecting the frame deformation at zero-set position in advance and storing it as reference data. This preliminary detection allows the system to later compensate for attitude changes by comparing current deformation against the pre-stored zero-set deformation, thereby maintaining measurement precision despite attitude changes.
Solution Approach 2:
The patent implements feedback by continuously monitoring frame deformation during measurement and using this information to compensate for measurement errors. The deformation detection section provides real-time feedback on frame deformation, which the control section uses to adjust and correct measurement values, maintaining precision even when attitude changes occur.
2Device complexity
If frame deformation is not compensated, then device complexity is reduced, but measurement precision deteriorates due to attitude changes
Solution Approach 1:
The patent replaces complex mechanical compensation mechanisms with an electronic sensing and computational system. Instead of using mechanical devices to physically compensate for frame deformation, the system uses a deformation detection section (such as strain gauges) and electronic processing to detect and compensate for deformation, simplifying the mechanical structure while maintaining or improving measurement precision.
Solution Approach 2:
The patent introduces an intermediary deformation detection section that measures frame deformation without being part of the measurement force transmission path. This intermediary sensing system allows the frame to deform naturally under measurement forces while the detected deformation information is used to compensate for measurement errors, avoiding the need for complex mechanical compensation mechanisms.
3Measurement precision
If compensation for frame deformation is implemented, then measurement precision is improved, but device complexity increases due to additional components
Solution Approach 1:
The patent applies universality by designing the frame deformation detection system to serve multiple functions. The same deformation detection section is used both for compensating measurement errors and for detecting frame deformation at zero-set position. The control section performs multiple tasks including zero-set deformation detection, storage, and compensation calculations, reducing the need for separate dedicated components for each function.
Solution Approach 2:
The patent implements self-service by enabling the micrometer to automatically detect, store, and compensate for its own frame deformation without requiring external calibration equipment or additional measurement devices. The system uses its own deformation detection section and control section to perform self-calibration at zero-set position and self-compensation during measurement, eliminating the need for external services or equipment.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach improves the repeatability and accuracy of micrometer measurements by compensating for frame deformations, reducing measurement errors and allowing easy, low-cost setting of compensation factors, regardless of environmental changes.
Implementation Method 1
a deformation detecting section that detects a deformation of the frame
Data Source
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AI summary
A micrometer (1) includes: a frame (10); an anvil (11); a spindle (20); an encoder (40); a display (60); a strain gauge (50) that detects a deformation of the frame; a storage that stores a change amount of the detection value (a displacement of the spindle detected by the encoder) per a unit deformation detected by the strain gauge, as a compensation factor; and a compensator that compensates the detection value based on a difference between a zeroset-time deformation that is detected by the strain gauge when a command for zeroset is given and a measurement-time deformation that is detected by the strain gauge in measurement, and based on the compensation factor stored in the storage.