Microparticle Measuring Apparatus Optical Axis Correction

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Solution Overview

Problem

Existing microparticle measuring apparatuses, particularly flow cytometers, face challenges in maintaining accurate optical axis alignment due to vibrations, pressure changes, and temperature fluctuations, leading to decreased measurement accuracy and potential disruption of measurement processes, especially in microchip-based systems where temperature affects the microchip's position.

Innovation Solution

A microparticle measuring apparatus that includes a flow channel, optical detecting means, solution feeding means, and optical axis correcting means, which automatically adjusts the relative position of the flow channel with respect to the laser beam using reference microparticles to optimize signal intensity, and can switch between sample and calibration solutions to correct for optical axis displacement caused by vibrations and temperature changes.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If optical axis correction is performed manually using histogram data of microbeads, then initial measurement accuracy can be achieved, but measurement accuracy deteriorates over time due to vibrations, pressure changes, and temperature fluctuations

Engineering Contradiction:
Improvemeasurement accuracyVSAvoidstability of optical axis alignment
Core Design Contradiction:
Measurement precisionVSReliability

Solution Approach 1:

The patent applies preliminary action by performing optical axis correction using reference microparticles before actual measurement begins. The system pre-establishes the correct optical axis alignment by detecting reference microparticles and adjusting the optical system accordingly, ensuring accurate measurements from the start while compensating for environmental changes that occur during subsequent measurements

Inventive Principle:
Principle #10Preliminary action

Solution Approach 2:

The patent implements feedback by continuously monitoring measurement data and comparing it against expected values. When deviations are detected (indicating optical axis displacement due to vibrations or temperature changes), the system automatically triggers optical axis correction using reference microparticles, creating a closed-loop control system that maintains measurement accuracy throughout the measurement process

Inventive Principle:
Principle #23Feedback

2Measurement precision

If optical axis correction is performed frequently to maintain accuracy, then measurement precision is maintained, but measurement time and productivity decrease

Engineering Contradiction:
Improveoptical axis alignment accuracyVSAvoidmeasurement throughput
Core Design Contradiction:
Measurement precisionVSProductivity

Solution Approach 1:

The patent applies self-service by enabling the optical system to automatically detect and correct its own misalignment using reference microparticles. The system monitors its own performance and performs self-correction without requiring manual intervention, thereby maintaining high measurement precision while minimizing the time lost to correction procedures through automated, rapid alignment adjustments

Inventive Principle:
Principle #25Self-service

3Ease of operation

If manual optical axis correction is performed, then operator control over measurement conditions is maintained, but device complexity and ease of operation are reduced due to manual adjustment requirements

Engineering Contradiction:
Improveautomatic optical axis correctionVSAvoidoptical axis correction system
Core Design Contradiction:
Ease of operationVSDevice complexity

Solution Approach 1:

The patent replaces manual mechanical adjustment of the optical system with an automated detection and correction mechanism. Instead of requiring operators to physically adjust lenses or mirrors based on histogram analysis, the system uses automated detection of reference microparticles and electronic control of optical components, substituting mechanical manual operations with automated electronic systems that simplify user interaction while managing the inherent complexity internally

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

Enables highly accurate and stable measurement by automatically correcting optical axis displacement during measurement, ensuring consistent detection of microparticle characteristics despite environmental changes and apparatus vibrations.

Implementation Method 1

The microparticles passing in a line through the flow cell are illuminated with a laser beam, and the scattered light or fluorescent light emanating from them is detected

Methodology Applied
Scientific EffectFluorescence: Fluorescence

Implementation Method 2

the scattered light or fluorescent light emanating from them is detected for determination of their characteristic properties

Methodology Applied
Scientific EffectLight scattering: Scattering

Data Source

PatentUS8482731B2Microparticle measuring apparatus
Publication Date: 2013.07.09 FELICA NETWORKS INC
  • US8482731B2 patent drawing
  • US8482731B2 patent drawing
  • US8482731B2 patent drawing

AI summary

A microparticle measuring apparatus which includes a flow channel through which a solution containing microparticles flows, an optical detecting unit configured to direct a laser beam to microparticles passing through the flow channel and detecting light for measurement emanating from the microparticles and converting the thus detected light into electrical signals, a solution feeding unit configured to feed the flow channel with either a sample solution containing microparticles of interest or a calibration solution containing reference microparticles that exhibit uniform optical characteristics, and an optical axis correcting unit configured to optimize the relative position of the flow channel with respect to the laser beam in response to the intensity of electrical signals from the reference microparticles.