Non-contact Micropipette Tip Positioning via Light Scatter
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Solution Overview
Problem
Existing methods for determining the position of a small sharp-tipped object, such as a micropipette, often require physical contact with the substrate, which can damage the tip and limit substrate material options, and rely on expensive electrical equipment for resistance monitoring.
Innovation Solution
A non-contact method using a light beam of known dimensions projected near the micropipette tip, where light scatter is detected to determine the tip's position relative to the beam, allowing for precise adjustment without physical contact and enabling three-axis positioning.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If physical contact methods are used to determine tip position, then positioning can be achieved, but the tip may be damaged and substrate material options are limited
Solution Approach 1:
The patent replaces mechanical contact-based position detection with an optical detection system. A light source projects a light beam through the tip, and a sensor detects the light transmission to determine tip position. This substitution eliminates mechanical contact that could damage the tip while maintaining precise positioning capability.
Solution Approach 2:
The patent introduces light as an intermediary medium between the tip and the detection system. Instead of direct mechanical contact, light passes through the tip to convey position information to the sensor, enabling non-contact measurement and avoiding tip damage.
2Measurement precision
If physical contact methods with resistance monitoring are used, then tip position can be determined, but expensive electrical equipment is required
Solution Approach 1:
The patent replaces expensive electrical resistance monitoring equipment with a simpler optical detection system. The light source and light sensor provide a cost-effective alternative to electrical measurement devices while achieving the same function of tip position determination.
3Measurement precision
If contact-based resistance monitoring is used to determine tip position, then positioning is achieved, but substrate material options are limited to conductive materials
Solution Approach 1:
The patent replaces electrical resistance monitoring with optical detection, which does not require the substrate to be conductive. This allows the system to work with a wide variety of substrate materials including insulators, enabling greater versatility in material selection.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This method allows for precise positioning of the micropipette tip with high accuracy (200 nm or less) without damaging the tip, reduces equipment costs, and expands substrate material options by eliminating the need for conductive substrates and electrical resistance monitoring.
Implementation Method 1
Light scatter indicative of the tip of the object being positioned within the dimensions of the light beam is detected
Data Source
AI summary
Systems and methods are described for a non-contact method for positioning a tip of an object. A light beam of known dimensions is projected and a position of the tip of the object relative to the light beam is adjusted. Light scatter indicative of the tip of the object being positioned within the dimensions of the light beam is detected and a position of the tip of the object is determined based at least in part on the known dimensions of the light beam and the detected light scatter.