Microplasma Chamber with Floating Potential Control

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Solution Overview

Problem

Existing plasma technologies face challenges in generating and controlling microplasma in an intermediate region, which is crucial for applications like ion sources and gas analysis, as they require precise management of floating potential to ensure stability and accuracy.

Innovation Solution

A plasma generating device with a dielectric wall chamber that uses RF and magnetic fields to create microplasma, featuring a floating potential control mechanism with an electrode along the inner surface to manage the plasma's potential, allowing for the generation of microplasma in a controlled environment without the need for assist gases like argon.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If an electrode is disposed inside the chamber to control floating potential, then plasma stability is improved, but device complexity increases

Engineering Contradiction:
Improveplasma stabilityVSAvoiddevice complexity
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The electrode structure is segmented into multiple independent electrodes disposed at different positions within the chamber, allowing separate control of floating potential at different locations. This segmentation enables precise plasma stability control while maintaining manageable device complexity through modular electrode design.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

A dielectric layer is introduced as an intermediary between the electrode and the plasma chamber wall. This dielectric intermediary allows the electrode to control floating potential without direct contact with plasma, preventing electrode contamination and damage while maintaining plasma stability control.

Inventive Principle:
Principle #24Intermediary (Mediator)

2Ease of manufacture

If assist gases like argon are used to generate plasma, then plasma generation is easier, but measurement precision deteriorates due to gas interference

Engineering Contradiction:
Improveplasma generation easeVSAvoidmeasurement precision
Core Design Contradiction:
Ease of manufactureVSMeasurement precision

Solution Approach 1:

The invention extracts and removes assist gases from the plasma generation system, enabling plasma to be generated using only the target gas. This extraction of unnecessary components eliminates gas interference in measurements while maintaining plasma generation capability through optimized RF power coupling and chamber design.

Inventive Principle:
Principle #2Taking out (Extraction)

Solution Approach 2:

The operating parameters are changed to enable assist-gas-free plasma generation, including optimization of RF power frequency, power level, and chamber pressure. These parameter changes allow direct plasma generation from target gas molecules, improving measurement precision by eliminating spectral interference from assist gas lines.

Inventive Principle:
Principle #35Parameter changes

3Measurement precision

If RF power is increased to generate plasma without assist gases, then measurement precision is improved, but energy consumption increases

Engineering Contradiction:
Improvemeasurement precisionVSAvoidenergy consumption
Core Design Contradiction:
Measurement precisionVSUse of energy by moving object

Solution Approach 1:

The RF power supply is designed with dynamic control capability, allowing real-time adjustment of power levels based on plasma density requirements. This dynamic control enables using higher power only when needed for plasma initiation and maintenance, reducing overall energy consumption while preserving measurement precision.

Inventive Principle:
Principle #15Dynamics

Solution Approach 2:

A feedback control system monitors plasma characteristics (such as impedance, power absorption, or optical emission) and automatically adjusts RF power input to maintain optimal plasma conditions. This feedback mechanism prevents excessive energy consumption by delivering only the necessary power for precise measurements without wasteful over-powering.

Inventive Principle:
Principle #23Feedback

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

Enables stable and precise generation of microplasma for applications such as gas analysis, providing high-precision measurements and efficient monitoring of process gases without the interference of support gases, leading to accurate and long-term monitoring capabilities.

Implementation Method 1

an RF supplying mechanism that generates the plasma inside the chamber using an electric field and/or a magnetic field through the dielectric wall structure

Methodology Applied
Scientific EffectRadio frequency field: Electromagnetic Induction

Implementation Method 2

a chamber which is equipped with a dielectric wall structure... an RF supplying mechanism that generates the plasma inside the chamber using an electric field and/or a magnetic field through the dielectric wall structure

Methodology Applied
Scientific EffectDielectric heating: Dielectric Heating

Implementation Method 3

a floating potential supplying mechanism that includes a first electrode disposed along an inner surface of the chamber... the floating potential of the microplasma is controlled by surrounding at least a part of the generated microplasma by disposing an electrode along an inner surface

Methodology Applied
Scientific EffectElectrostatic field: Electric Field

Data Source

PatentUS11996278B2Plasma generating device
Publication Date: 2024.05.28 ATONARP
  • US11996278B2 patent drawing
  • US11996278B2 patent drawing
  • US11996278B2 patent drawing

AI summary

A plasma generating device includes: a chamber which is equipped with a dielectric wall structure and into which sample gas to be measured flows; an RF supplying mechanism that generates plasma inside the chamber using an electric field and/or a magnetic field through the dielectric wall structure; and a floating potential supplying mechanism that includes a first electrode disposed along an inner surface of the chamber. The RF supplying mechanism may include an RF field forming unit disposed in a first direction with respect to the chamber and the first electrode may include an electrode disposed in a second direction with respect to the chamber.