Optical Inspection with Adhesive Capture for Microplastics

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Solution Overview

Problem

Optical analysis of microplastics is challenging due to their tendency to overlap, requiring manual separation and significant labor, which hinders efficient and accurate inspection.

Innovation Solution

An optical inspection apparatus and method that includes a biasing section to disperse microplastics, a catching section with adhesive portions to separate and fix individual pieces, and an analysis section for optical analysis.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If manual separation of microplastics is performed to avoid overlapping, then measurement precision is improved, but productivity deteriorates due to large amount of labor and time required

Engineering Contradiction:
Improveoptical analysis accuracyVSAvoidinspection throughput
Core Design Contradiction:
Measurement precisionVSProductivity

Solution Approach 1:

The system uses automated image recognition and control algorithms to identify overlapping microplastics and control their movement, replacing manual separation operations. The apparatus autonomously determines when separation is needed and executes the separation process without operator intervention, thereby maintaining measurement precision while dramatically improving productivity

Inventive Principle:
Principle #25Self-service

Solution Approach 2:

The invention replaces the mechanical manual separation process with an automated optical-mechanical system. Image recognition captures the positions of microplastics, the control unit processes this information to identify overlaps, and the stage positioning system automatically adjusts to separate overlapping particles, eliminating the need for manual labor while maintaining separation effectiveness

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

2Measurement precision

If manual separation is performed to achieve accurate optical analysis, then measurement precision is improved, but loss of time increases due to labor-intensive process

Engineering Contradiction:
Improvelight absorption measurement accuracyVSAvoidsample preparation time
Core Design Contradiction:
Measurement precisionVSLoss of time

Solution Approach 1:

The system performs preliminary image recognition and overlap detection before the optical analysis measurement is taken. By identifying and separating overlapping microplastics in advance through automated image processing and stage positioning, the system ensures that measurements are taken on properly separated samples without requiring time-consuming manual separation during the analysis phase

Inventive Principle:
Principle #10Preliminary action

Solution Approach 2:

The invention replaces time-consuming manual separation with an automated system that uses image recognition to detect overlaps and control mechanisms to separate particles. This substitution dramatically reduces the time required for sample preparation while ensuring that measurements are performed on adequately separated microplastics

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

Enables efficient and accurate optical analysis of microplastics without manual labor, allowing for automated sample preparation and improved throughput.

Implementation Method 1

a biasing section configured to apply, to a group of objects on a stage, a force for moving the group of objects away with respect to the stage

Methodology Applied
Scientific EffectForce: Force

Implementation Method 2

a catching section including an adhesion portion to which an object in the group of objects moved from the stage adheres

Methodology Applied
Scientific EffectAdhesion: Adhesive

Data Source

PatentUS12405214B2Optical inspection apparatus and optical inspection method
Publication Date: 2025.09.02 SHIMADZU CORP
  • US12405214B2 patent drawing
  • US12405214B2 patent drawing
  • US12405214B2 patent drawing

AI summary

One mode of an optical inspection apparatus according to the present invention is an optical inspection apparatus for optically inspecting an object, the optical inspection apparatus including: a biasing section (20) configured to apply, to a group of objects (23A) on a stage, a force for moving the group of objects away with respect to the stage (22); a catching section (24) including an adhesion portion (241) to which an object in the group of objects moved from the stage adheres; and an analysis section (3) configured to optically analyze the object caught by the catching section. This makes it possible to efficiently and satisfactorily perform optical analysis of individual microplastics by eliminating manual work of picking up the microplastics one by one.