Microscale Surface Normal and Reflectance Measurement System
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Solution Overview
Problem
Current methods fail to simultaneously measure surface normal vectors and surface reflectance functions at the microscale, as these are typically collected using different schemes and systems, leading to inconsistencies and reduced measurement accuracy.
Innovation Solution
A system and method utilizing a light dome with hundreds of LEDs for spherical harmonics and pointwise illumination, combined with an xyz micro-translation stage and macro lens camera, to capture microscale images, calculate surface normal vectors using shape-from-specular schemes, and update surface reflection functions by optimizing normal distribution and geometric structure terms.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Adaptability or versatility
If separate schemes are used to collect appearance and normals, then each can be measured independently, but they cannot be simultaneously collected through one system
Solution Approach 1:
The patent merges the appearance measurement and normal measurement capabilities into a single integrated system. The light dome with multiple LEDs provides both spherical harmonics illumination for appearance measurement and pointwise illumination for normal measurement, while the camera captures both types of information simultaneously from the same viewpoint, eliminating the need for separate measurement schemes.
Solution Approach 2:
The measurement system is designed with multi-functionality to perform both appearance characterization and normal vector measurement using the same hardware setup. The light dome can operate in different illumination modes (spherical harmonics and pointwise), and the camera can capture both diffuse and specular reflection information, making the system universal for various microscale surface property measurements.
2Measurement precision
If multiple separate systems are used for appearance and normal measurement, then each system can be optimized for its specific function, but measurement accuracy and consistency are reduced
Solution Approach 1:
By combining appearance and normal measurement into one system with a single camera and coordinated illumination, the patent ensures that both measurements are taken from the same viewpoint under controlled conditions. This integration eliminates inconsistencies that would arise from separate systems and improves the accuracy and reliability of the measured data.
Solution Approach 2:
The system uses feedback mechanisms to optimize the measurement process. The control unit coordinates the illumination patterns and camera capture based on previous measurements and optimization results, allowing iterative refinement of the measurement accuracy by adjusting illumination configurations and capture parameters.
3Productivity
If a light dome with hundreds of LEDs is used for spherical harmonics and pointwise illumination, then simultaneous measurement is enabled, but device complexity increases
Solution Approach 1:
The light dome is segmented into multiple independent LED regions that can be controlled separately. This segmentation allows the system to switch between spherical harmonics illumination (using multiple LEDs in different patterns) and pointwise illumination (using specific LED groups), enabling versatile measurement capabilities while managing the complexity through modular control.
Solution Approach 2:
The illumination system is made dynamic through electronic control of individual LEDs, allowing real-time switching between different illumination modes. The control unit can activate specific LED groups for spherical harmonics or pointwise illumination based on the measurement requirements, making the system adaptable and efficient without requiring physical reconfiguration.
4Measurement precision
If microscale images are captured for normal vector calculation, then detailed surface information is obtained, but vibration during imaging degrades quality
Solution Approach 1:
The patent incorporates vibration isolation mechanisms that are activated before and during the image capture process. These isolation systems cushion against external vibrations and mechanical disturbances, creating a stable imaging environment that protects the microscale image quality from degradation due to vibration during the measurement process.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach allows for simultaneous and accurate measurement of surface normal vectors and reflection functions at the microscale, reducing measurement complexity and improving accuracy, and can be applied to various objects, including those in microscope camera systems.
Implementation Method 1
a light dome having a hemispherical-shaped structure and including hundreds of LEDs at compactness of a preset interval to radiate light to an object placed therein
Implementation Method 2
a macro lens installed camera arranged over the light dome to photograph the object through a hole formed at a center of the light dome
Data Source
AI summary
Disclosed is a system for simultaneously measuring a surface normal vector and a surface reflection function in microscale. The system includes a light dome having a hemispherical-shaped structure and including LEDs to radiate light to an object placed therein; a macro lens installed camera arranged over the light dome to photograph the object through a hole formed at a center of the light dome under an environment in which a light is radiated from the light dome; an xyz micro-translation stage arranged under the light dome and configured to move in xyz-directions to adjust a focal distance between the macro lens installed camera and the object, and a measurement unit configured to control the light dome and the macro lens installed camera to obtain a microscale image, and configured to simultaneously measure a surface normal vector and a surface reflection function of the object based on the microscale image.