Microscope System 3D Observation Area Estimation
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Solution Overview
Problem
Current microscope systems face challenges in efficiently acquiring three-dimensional images of specimens regardless of their shape, leading to inefficient observation and potential damage.
Innovation Solution
A microscope system that includes an approximate-shape setting portion to define a three-dimensional observation area based on the specimen's shape, and a control unit to acquire high-resolution images within this area, minimizing unnecessary observation and reducing specimen damage.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Adaptability or versatility
If a plurality of partial image groups are acquired at various depth positions to create a map image, then three-dimensional observation capability is achieved, but observation time and processing complexity increase significantly
Solution Approach 1:
The patent applies preliminary action by acquiring a reference image before the actual observation process. This reference image is used to determine the observation area in advance, allowing the system to pre-calculate which regions require detailed three-dimensional imaging. By performing this area determination beforehand, the system avoids acquiring images from unnecessary regions during the main observation process, thereby significantly reducing observation time while maintaining three-dimensional observation capability.
2Measurement precision
If the entire specimen is observed at high resolution, then detailed information is obtained, but specimen damage increases and observation efficiency decreases
Solution Approach 1:
The patent applies local quality by differentiating the observation strategy between different regions of the specimen. The reference image is used to identify regions of interest that require high-resolution detailed observation, while other regions are either observed at lower resolution or skipped entirely. This localized approach ensures that high-resolution imaging is applied only where necessary, minimizing cumulative specimen damage from repeated high-intensity illumination while maintaining detailed information quality in critical areas.
3Reliability
If multiple image acquisitions are performed to ensure complete coverage, then observation completeness is improved, but productivity and efficiency decrease
Solution Approach 1:
The patent uses preliminary action by acquiring a reference image that serves as a guide for subsequent observation. This reference image allows the system to pre-determine the exact boundaries and extent of the observation area, enabling precise planning of the imaging strategy. By having this information in advance, the system can acquire images efficiently with appropriate overlap and coverage without unnecessary repetitions, ensuring complete observation while maximizing productivity.
Data Source
AI summary
A three-dimensional image is easily, quickly, and efficiently acquired, regardless of the shape of a specimen or other factors. The present invention provides a microscope system including: a microscope that acquires an image of a specimen; a reference-shape setting portion that sets an approximate shape of the specimen; an observation-area estimating portion that sets a three-dimensional observation area of the specimen according to the reference shape set by the reference-shape setting portion; and a control unit that controls the microscope so as to acquire a three-dimensional observation image of the observation area set by the observation-area estimating portion.