Microscope-Based 3D Shape Measurement with Flat-Region Extraction

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Solution Overview

Problem

Conventional microscopes struggle to accurately capture 3D images of object surfaces, and non-contact 3D measuring instruments are costly, while ToF methods are inaccurate.

Innovation Solution

An information processing device that uses a microscope with multiple light sources to capture images from different positions, extracts flat regions based on luminance values, and calculates shape information using machine learning to improve depth calculation accuracy.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If conventional microscope technology is used to capture images, then image quality can be improved, but it is difficult to obtain accurate 3D shape information

Engineering Contradiction:
Improveshape measurement accuracyVSAvoidmeasurement system complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The patent transitions from 2D planar image capture to 3D shape measurement by introducing multiple light sources arranged at different positions. This dimensional approach allows the system to capture depth information and reconstruct 3D surface shapes, resolving the limitation of conventional microscopes that can only produce flat images.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

Solution Approach 2:

The patent segments the measurement process into distinct stages: capturing images from multiple light source positions, extracting flat regions based on luminance values, and calculating shape information separately. This segmentation allows each component to be optimized independently while achieving accurate 3D measurement without requiring a completely complex integrated system.

Inventive Principle:
Principle #1Segmentation

2Measurement precision

If non-contact 3D measuring instruments or 3D scanners are used, then accurate 3D shape measurement can be achieved, but the cost becomes relatively high

Engineering Contradiction:
Improve3D shape measurement accuracyVSAvoidsystem cost
Core Design Contradiction:
Measurement precisionVSEase of manufacture

Solution Approach 1:

The patent uses a standard microscope as the base device and creates a virtual 3D measurement system through computational methods. Instead of requiring expensive dedicated 3D scanning hardware, the system copies the imaging capability of a conventional microscope and adds software-based 3D reconstruction algorithms, significantly reducing costs while maintaining measurement accuracy.

Inventive Principle:
Principle #26Copying

Solution Approach 2:

The patent makes a conventional microscope multi-functional by enabling it to perform both 2D image capture and 3D shape measurement. By adding multiple light sources and implementing 3D reconstruction algorithms, the same microscope hardware serves dual purposes, eliminating the need to purchase separate expensive 3D scanning equipment.

Inventive Principle:
Principle #6Universality (Multi-functionality)

3Ease of manufacture

If ToF method is used for distance measurement, then the device cost is relatively inexpensive, but the measurement accuracy is insufficient

Engineering Contradiction:
Improvedevice costVSAvoiddistance measurement accuracy
Core Design Contradiction:
Ease of manufactureVSMeasurement precision

Solution Approach 1:

The patent replaces the optical ToF measurement method with a geometric calculation approach based on photogrammetry. Instead of using time-of-flight sensors that measure distance through light travel time, the system uses multiple light sources and 2D image capture followed by computational 3D reconstruction, achieving higher accuracy with lower-cost components.

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

Enhances the accuracy of shape measurement by identifying flat regions in captured images, allowing for precise 3D reconstruction of object surfaces.

Implementation Method 1

The captured image is an image obtained from reflected light of light emitted to the target from a plurality of light sources arranged at different positions, respectively

Methodology Applied
Scientific EffectReflection: Reflection

Data Source

PatentUS12361573B2Information processing apparatus and information processing method for shape measurement of target
Publication Date: 2025.07.15 SONY GROUP CORP
  • US12361573B2 patent drawing
  • US12361573B2 patent drawing
  • US12361573B2 patent drawing

AI summary

Provided is an information processing device that includes a control unit. The control unit acquires a captured image of a target imaged by a sensor. The captured image is an image obtained from reflected light of light emitted to the target from a plurality of light sources arranged at different positions, respectively. The control unit extracts a flat region from the captured image based on a luminance value of the captured image. The control unit calculates shape information regarding a shape of a surface of the target based on information regarding the sensor and the flat region of the captured image.