Microscope Spherical Aberration Correction via Adaptive Sampling
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Solution Overview
Problem
Current microscope systems face challenges in efficiently correcting spherical aberration caused by varying sample depths, as existing methods are time-consuming and may not accurately utilize correction collars, leading to incomplete correction and potential sample damage.
Innovation Solution
A microscope system that includes a correction device and a computing device to obtain and analyze image data at different setting values, calculating evaluation values and target settings to optimize spherical aberration correction, allowing for precise adjustment and reduced sample damage through automated processes.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If manual adjustment of correction collar is used, then operator can control spherical aberration correction, but correction process is time-consuming and may not achieve accurate correction
Solution Approach 1:
The system performs automatic measurement and calculation of spherical aberration correction settings without requiring manual operator intervention. The microscope apparatus automatically obtains image data at multiple setting values, the computing device calculates evaluation values and determines optimal settings, and the correction collar is automatically adjusted to the calculated target value, enabling the system to correct its own aberration without human assistance.
Solution Approach 2:
The patent replaces manual mechanical adjustment of the correction collar with an automated computational system. Instead of relying on operator experience and manual trial-and-error adjustment, the system uses image data analysis, evaluation value calculation, and automated control to determine and apply the optimal correction settings, substituting mechanical manual operation with computational automation.
2Reliability
If correction collar is adjusted without automated feedback, then operation is simple, but spherical aberration may not be fully corrected and sample damage may occur
Solution Approach 1:
The system implements a closed-loop feedback mechanism where image data is obtained at multiple correction collar settings, evaluation values are calculated from this data, and the optimal settings are automatically applied. This feedback loop ensures that spherical aberration is reliably corrected by continuously monitoring image quality and adjusting the correction collar based on quantitative evaluation, rather than relying on subjective visual assessment.
Solution Approach 2:
The system performs preliminary measurements and calculations before final correction is applied. Multiple image data are obtained at different setting values, evaluation values are calculated in advance, and the optimal target value is determined beforehand. This preliminary action ensures that the correction is both reliable and efficient, avoiding trial-and-error adjustment and potential sample damage.
3Measurement precision
If multiple image data are obtained at different setting values, then correction accuracy is improved, but measurement time increases
Solution Approach 1:
The system obtains multiple image data at different setting values (excessive action) to ensure sufficient data for accurate correction, but the computing device efficiently processes this data by calculating evaluation values and determining optimal settings through systematic analysis. This approach ensures high precision correction while maintaining acceptable measurement efficiency through automated processing.
Solution Approach 2:
The system changes the setting values of the correction collar to obtain image data at multiple positions, then uses the computing device to analyze these parameters and determine the optimal setting. By systematically varying the setting values and using automated parameter analysis, the system achieves high precision correction without excessive time consumption.
Data Source
AI summary
A microscope system includes a microscope apparatus and a computing device. The microscope apparatus obtains image data of a surface to be observed of a sample in each of the plurality of states having different setting values of a correction collar. The computing device calculates an evaluation value of image data on the basis of each of the plural pieces of image data. A process in which the microscope apparatus obtains the plural pieces of image data is repeated in such a way that a distribution range and an average interval of the setting values are narrowed in each repetition, and that the setting value that corresponds to a maximum evaluation value is included within the distribution range. The computing device calculates the setting value for correcting a spherical aberration on the basis of the evaluation values and the setting values that correspond to the evaluation values.