Microscope Aberration Correction via Eccentric Optical Measurement
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Solution Overview
Problem
Conventional microscopes inaccurately determine spherical aberrations due to neglecting factors like refractive index of the medium and cover slip, and existing methods are time-consuming and harmful to light-sensitive specimens.
Innovation Solution
A microscope with an optical imaging system, adjustable correction means, a microscope drive, a position sensitive detector, and an optical measuring system that forms two measuring light beams with different eccentric distances to the optical axis, allowing for accurate determination of spherical aberration by recording and analyzing the positions of reflection light beams on a detector.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If conventional model functions are used to determine spherical aberration based on limited parameters (cover slip thickness only), then the determination process is simple, but the measurement precision is insufficient due to neglecting other factors like refractive index
Solution Approach 1:
The patent changes the parameters used for aberration determination from simple geometric parameters (cover slip thickness only) to optical parameters that include refractive indices of the cover slip and embedding medium. This allows accurate determination of spherical aberration by measuring the actual optical properties rather than relying on approximate models, thereby improving measurement precision without requiring complex additional hardware.
Solution Approach 2:
The patent replaces mechanical measurement methods (physical measurement of cover slip thickness with calipers) with optical measurement methods (using the optical measuring system to determine refractive indices and calculate aberration). This substitution enables more precise measurement of optical parameters that directly influence spherical aberration, improving accuracy while maintaining system simplicity.
2Measurement precision
If multiple images are generated for interpolation-based correction adjustment, then the correction precision can be improved, but the loss of time increases and light-sensitive specimens are damaged due to phototoxicity and fading
Solution Approach 1:
The patent performs preliminary determination of spherical aberration using the optical measuring system before actual specimen examination. By calculating the aberration from refractive index measurements and cover slip parameters in advance, the system eliminates the need for time-consuming iterative image acquisition and interpolation during specimen examination, thereby reducing examination time and protecting light-sensitive specimens from excessive light exposure.
Solution Approach 2:
The patent extracts the aberration determination process from the specimen imaging process by using a separate optical measuring system that operates independently. This allows aberration parameters to be measured and calculated without generating multiple specimen images, thus avoiding phototoxicity and fading while maintaining correction precision.
3Measurement precision
If experienced operators perform manual evaluation and interpolation point generation, then the correction precision can be improved, but the ease of operation decreases and the process becomes time-consuming
Solution Approach 1:
The patent implements an automated optical measuring system that performs aberration determination independently without requiring operator intervention for image evaluation or interpolation point generation. The system automatically measures refractive indices, calculates spherical aberration parameters, and provides correction values, thereby improving ease of operation while maintaining high precision through consistent algorithmic processing.
Solution Approach 2:
The patent replaces manual operator evaluation with an automated optical measurement and calculation system. The optical measuring system objectively determines refractive indices and calculates aberration parameters without subjective human judgment, improving both ease of operation (no specialized skills needed) and measurement precision (consistent, repeatable results).
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables easy and accurate determination of spherical aberration, allowing for precise correction and reducing the impact on light-sensitive specimens, with the ability to correct aberrations quickly and reliably.
Implementation Method 1
receive a first reflection light beam that is created by a partial reflection of the first measuring light beam on a surface of the cover slip through the optical imaging system
Data Source
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AI summary
A microscope comprises an optical imaging system configured to image a specimen, comprising a cover slip, said optical imaging system comprising adjustable correction means, a microscope drive configured to adjust the distance between the cover slip and the optical imaging system along the optical axis thereof, a position sensitive detector, an optical measuring system, and a control unit. The optical measuring system is configured to form first and second measuring light beams, direct the measuring light beams into an entrance pupil of the optical imaging system with a different distances to the optical axis thereof, receive a first and second reflection light beam that is created by a partial reflection of the measuring light beams on the surface of the cover slip through the optical imaging system, and direct the first and second reflection light beams onto the position sensitive detector. The control unit is configured to record the positions of the first and second reflection light beams on the position sensitive detector, and determine an aberration based on the recorded positions of the first and second reflection light beams.