Microscope Aberration Measurement for Precise Focal Plane Adjustment
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Solution Overview
Problem
Existing microscopy techniques face challenges in accurately focusing on the sample plane due to issues like increased scan times and incorrect focus settings, particularly when dealing with samples covered by high refractive index materials that can lead to aberrations and misidentification of dirt as legitimate data.
Innovation Solution
A system and method that measures optical aberrations using a microscope with an imaging device, illumination system, and actuator to adjust the focal plane, allowing for precise focusing on the sample plane without additional hardware, by illuminating the sample at multiple angles and determining the amount of aberrations to adjust the focal position accordingly.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If z-stack scanning is performed to distinguish between sample layer and coverslip layer, then layer identification accuracy is improved, but scan time increases
Solution Approach 1:
The patent applies preliminary action by performing aberration measurement and focal plane determination at the beginning of the scanning process, before the main data acquisition. The system measures optical aberrations and determines the correct focal plane in advance, allowing subsequent scanning to proceed efficiently without needing to perform time-consuming z-stack scans for layer identification.
2Measurement precision
If special coverslip with markings is used to identify focal plane, then layer identification accuracy is improved, but device complexity increases
Solution Approach 1:
The patent applies self-service by enabling the microscope system to automatically determine the correct focal plane through computational methods based on optical aberration measurements. The system uses its own imaging capabilities and processing algorithms to identify the sample-coverslip interface without requiring external markings or specialized hardware modifications to the coverslip.
3Speed
If autofocus algorithm locks onto dirt on coverslip, then focusing speed is improved, but measurement precision deteriorates
Solution Approach 1:
The patent applies feedback by continuously monitoring optical aberration levels during the focusing process and using this information to adjust the focal plane determination. The system measures aberrations caused by the coverslip and sample, compares these measurements against expected values, and adjusts the focal plane accordingly to avoid locking onto dirt or incorrect layers, ensuring both speed and accuracy.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach reduces scan times and data size by accurately focusing on the sample plane, minimizing the impact of aberrations caused by coverslip materials like dirt, thereby improving the quality and efficiency of digital microscopy.
Implementation Method 1
measure, using the image sensor and the illumination system, optical aberrations of the imaging device at the axial position
Implementation Method 2
When preparing a slide, a high refractive index material can be applied on top of the specimen
Data Source
AI summary
A microscope for computational microscopic layer separation may include an imaging device that includes a lens and an image sensor, an illumination system for illuminating a sample, and an actuator to adjust an axial position of a focal plane with respect to the sample. The microscope may also include a processor operatively coupled to the imaging device and the illumination system. The processor may be configured to measure, using the image sensor and the illumination system, optical aberrations of the imaging device at the axial position, and determine whether to adjust the focal plane with respect to the sample in response to the one or more optical aberrations. Various other systems and methods are also disclosed.