Microscope Autofocus Using Split Optical Paths for Rapid Focus
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Solution Overview
Problem
Existing hardware-based autofocusing methods in microscopy face challenges in achieving high accuracy, large capture region, quick implementation, robustness, reproducibility, and low light exposure, while software-based methods are limited by sample visibility requirements.
Innovation Solution
A method that generates measurement light with a local structure, optically couples it into the microscope beam path, splits it into multiple paths of different lengths, and determines the focus position based on the sharpest image to achieve accurate and rapid autofocusing without additional mechanical drives or iterative processes.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If hardware-based autofocusing methods use additional optical units and iterative processes to achieve accurate focus determination, then measurement precision is improved, but device complexity and sample light exposure increase
Solution Approach 1:
The measurement light is divided into multiple component beams with different optical path lengths using beam splitting elements. Each component beam travels a different path and is detected separately, allowing focus determination through comparison of multiple measurements without requiring complex iterative hardware adjustments.
Solution Approach 2:
The patent replaces mechanical iterative focusing methods with an optical measurement approach. Instead of mechanically moving the objective or sample stage in iterations, the system uses optical beam splitting and path length variation to simultaneously obtain multiple focus measurements, eliminating mechanical complexity.
2Measurement precision
If hardware-based autofocusing uses additional optical units and iterative processes, then measurement precision is improved, but the capture region remains limited
Solution Approach 1:
The patent introduces optical path length as an additional dimension for measurement. By varying the optical path lengths of different component beams rather than relying solely on mechanical position adjustments, the system expands its measurement capability and capture region without compromising precision.
3Measurement precision
If iterative focusing processes are used to achieve accurate focus, then measurement precision is improved, but productivity decreases due to increased time and light exposure
Solution Approach 1:
The system performs preliminary measurements using multiple component beams with different optical path lengths simultaneously. This preliminary optical measurement provides focus information without requiring time-consuming iterative mechanical adjustments, thereby improving productivity while maintaining precision.
Solution Approach 2:
The patent enables continuous focus measurement by simultaneously detecting multiple component beams. Instead of stopping for iterative mechanical adjustments, the system continuously obtains focus information from parallel optical paths, maintaining productivity and reducing total focusing time.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Ensures accurate, rapid, and robust autofocusing with a large capture region and minimal light exposure by using measurement light to determine the focus position directly within the microscope beam path, eliminating the need for secondary focus drives and iterative methods.
Implementation Method 1
measurement light which is reflected by the sample passes through the objective
Implementation Method 2
The measurement light is optically input coupled into a microscope beam path, from which reflected measurement light is optically output coupled
Data Source
AI summary
According to a method for autofocusing on a microscopic sample, measurement light having a local structure is generated. The measurement light is coupled into the microscope beam path, whereby the measurement light is incident on, and reflected by, the sample. The measurement light reflected by the sample is output from the microscope beam path and split among a plurality of component beam paths which pass over optical paths of different lengths to image the reflected measurement light, whereby a plurality of measurement images assigned to different focus positions on the microscope beam path are obtained. At least the measurement image which comes closest to an ideal image of the local structure of the measurement light is selected. Depending on the focus position assigned to the selected measurement image, a focus position to be used on the microscope beam path for the purpose of microscopic imaging of the sample is set.