Analytical Microscope Calibration Element for Wide Magnification Alignment
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Solution Overview
Problem
Existing analytical microscopes face challenges in accurate calibration across a broad range of magnification levels due to limitations of standard reticles, manual error-prone processes, and inability to automate calibration, leading to issues like image registration errors, parcentricity errors, and incorrect magnification detection.
Innovation Solution
A substantially non-periodic calibration element with a multidimensional pattern of features that exhibits contrast when illuminated, enabling automated calibration across a wide range of magnifications using image correlation techniques to determine magnification levels and shifts.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Adaptability or versatility
If a standard reticle with periodic scale is used for calibration, then calibration can be performed at a specific magnification level, but it cannot provide accurate calibration across a broad range of magnification levels
Solution Approach 1:
The patent transitions from a one-dimensional periodic reticle scale to a two-dimensional non-periodic calibration element with features distributed across multiple spatial frequencies. This dimensional expansion allows the single calibration element to provide accurate reference points across a broad range of magnification levels simultaneously, resolving the contradiction between calibration range and precision.
Solution Approach 2:
The patent changes the fundamental parameter of the calibration pattern from periodic to non-periodic, and incorporates multiple spatial frequencies within a single calibration element. This parameter transformation enables the calibration element to maintain measurement precision across varying magnification levels while expanding the overall calibration range.
2Extent of automation
If manual point selection on a reticle is used for calibration, then the process can be performed with simple equipment, but it introduces user discretion errors and cannot be automated
Solution Approach 1:
The non-periodic calibration element with multiple spatial frequencies provides distinct, objectively identifiable features that enable automated image processing algorithms to detect and measure calibration points without user discretion. The feedback mechanism allows the system to automatically calculate magnification and correct parcentricity errors, achieving both automation and high precision simultaneously.
3Adaptability or versatility
If a single periodic reticle scale is used, then the device structure remains simple, but it requires multiple reticle embodiments to cover different magnification ranges
Solution Approach 1:
The patent creates a universal calibration element that performs multiple functions: it provides accurate calibration references for multiple magnification levels, enables automated image processing, and corrects parcentricity errors. This single multi-functional element replaces what would otherwise require multiple specialized reticles, achieving versatility without proportional increases in complexity.
Solution Approach 2:
The patent combines multiple spatial frequencies and non-periodic patterns into a single calibration element, merging the functions that would otherwise require separate reticles for different magnification ranges. This consolidation achieves broad magnification coverage while maintaining relatively simple device structure.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The solution allows for precise and automated calibration across a broad range of magnifications, reducing errors and ensuring accurate alignment and detection of magnification levels, thus improving the reliability of analytical microscopy.
Implementation Method 1
a substantially non-periodic pattern of features that exhibit contrast when illuminated by a light beam
Data Source
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AI summary
An embodiment of a calibration element for an analytical microscope is described that comprises a substantially non-periodic pattem of features that exhibit contrast when illuminated by a light beam.