Microscope Apparatus Using Coherent Light Interference for Super-Resolution

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Solution Overview

Problem

Conventional optical microscopes face limitations in resolution due to the diffraction limit of light, making it difficult to observe finer details such as internal cell structures without using electron microscopes, which cannot observe living cells.

Innovation Solution

A microscope apparatus that uses a coherent light source and an optical system to project multiple focal points onto a specimen, allowing them to interfere and change phases, thereby creating an illumination spot smaller than the diffraction limit, enabling super-resolution imaging.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If conventional optical microscopes are used, then the observation of living cells is possible, but the resolution is limited by the diffraction limit of light

Engineering Contradiction:
ImproveresolutionVSAvoidobservation capability
Core Design Contradiction:
Measurement precisionVSReliability

Solution Approach 1:

The illumination light is divided into multiple focal points arranged in a matrix pattern, rather than using a single focal point. This segmentation allows the light to interfere constructively and destructively, creating super-resolution effects that overcome the diffraction limit while maintaining the ability to observe living cells

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The patent changes the parameters of the illumination light by using coherent light and controlling the phase relationships between multiple focal points. By adjusting the phase differences and interference patterns, the system achieves resolution beyond the conventional diffraction limit

Inventive Principle:
Principle #35Parameter changes

2Measurement precision

If electron microscopes are used to achieve high resolution, then finer details can be observed, but living cells cannot be observed

Engineering Contradiction:
ImproveresolutionVSAvoidobservation of living cells
Core Design Contradiction:
Measurement precisionVSAdaptability or versatility

Solution Approach 1:

The patent replaces the mechanical/electronic system of electron microscopes with an optical system that uses coherent light and interference patterns. This substitution allows achieving electron-microscope-level resolution using non-destructive optical methods, enabling observation of living cells

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

3Measurement precision

If multiple focal points are projected and allowed to interfere, then super-resolution is achieved, but the system complexity increases

Engineering Contradiction:
ImproveresolutionVSAvoidoptical system complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The optical system is designed to perform multiple functions: it generates coherent light, creates multiple focal points, controls phase relationships, and detects interference patterns all within a unified microscope apparatus. This multi-functionality reduces the need for separate complex subsystems

Inventive Principle:
Principle #6Universality (Multi-functionality)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This approach allows for observing in super-resolution beyond the diffraction limit of light, providing higher phase difference resolution and enabling detailed observation of specimens without the need for electron microscopes, while still allowing for the observation of living cells.

Implementation Method 1

allow the plurality of focal points to interfere with each other while changing phases of the plurality of focal points

Methodology Applied
Scientific EffectInterference: Interference

Implementation Method 2

limitations in resolution due to the diffraction limit of light

Methodology Applied
Scientific EffectDiffraction: Diffraction

Data Source

PatentUS9715096B2Microscope apparatus
Publication Date: 2017.07.25 YOKOGAWA ELECTRIC CORP
  • US9715096B2 patent drawing
  • US9715096B2 patent drawing
  • US9715096B2 patent drawing

AI summary

A microscope apparatus includes a light source configured to emit a coherent illuminating light, an optical system configured to irradiate a specimen with the illumination light, and a detector configured to form an image based on a light generated from the specimen by the illumination light that irradiates the specimen. The optical system is configured to project a plurality of focal points of the illumination light on the specimen, and allow the plurality of focal points to interfere with each other while changing phases of the plurality of focal points.