Charged-Particle Microscope Composite Image Overlay

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Solution Overview

Problem

In microscopic applications, it is challenging to relate and analyze images of different magnifications and detector configurations acquired using charged-particle microscopes, making comprehensive studies of complex objects time-consuming due to the difficulty in comparing images from various settings.

Innovation Solution

A method for operating a charged-particle microscope that involves recording and displaying images from different settings within a single image, using indicators to differentiate between settings, allowing users to visualize and select specific image regions and settings efficiently.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Adaptability or versatility

If multiple images of different magnifications and detector configurations are acquired for comprehensive object analysis, then the completeness of object study is improved, but the difficulty of comparing and relating these images increases

Engineering Contradiction:
Improvecompleteness of object studyVSAvoiddifficulty of comparing images
Core Design Contradiction:
Adaptability or versatilityVSDifficulty of detecting and measuring

Solution Approach 1:

The patent merges multiple images acquired under different microscope settings (magnification, detector configuration, kinetic energy) into a single composite display. Each original image is represented as an overlay on the composite image, allowing simultaneous visualization and comparison of all images. This resolving means directly addresses the contradiction by combining multiple images into one unified view, improving completeness of analysis while eliminating the difficulty of comparing separate images.

Inventive Principle:
Principle #5Merging (Combining)

Solution Approach 2:

The patent introduces a composite image as an intermediary representation that mediates between multiple original images. The composite image serves as a reference framework that shows the spatial relationships and relative positions of features across all original images. This intermediary structure enables easy comparison and correlation of features from different imaging conditions without requiring direct comparison of multiple separate images.

Inventive Principle:
Principle #24Intermediary (Mediator)

2Adaptability or versatility

If images from different detector configurations (SE, BSE, EDX) are used to reveal different object characteristics, then the comprehensiveness of analysis is improved, but the complexity of determining how images are related increases

Engineering Contradiction:
Improvecomprehensiveness of analysisVSAvoidcomplexity of determining image relationships
Core Design Contradiction:
Adaptability or versatilityVSDevice complexity

Solution Approach 1:

The patent combines images from different detector configurations (secondary electron detector, backscattered electron detector, energy-dispersive spectrometer) into a single composite display. Each detector's image is overlaid on the composite image with visual indicators showing which detector was used. This allows comprehensive analysis of topographic features, compositional information, and elemental distribution simultaneously, while the unified display eliminates the complexity of determining relationships between separate images from different detectors.

Inventive Principle:
Principle #5Merging (Combining)

3Measurement precision

If a user manually browses through multiple images to identify object features and select locations for further imaging, then thorough analysis is achieved, but the time required for analysis increases

Engineering Contradiction:
Improvethoroughness of analysisVSAvoidtime required for analysis
Core Design Contradiction:
Measurement precisionVSLoss of time

Solution Approach 1:

The patent merges multiple images into a single composite display that provides an overview of all imaged regions and their relationships. Users can identify object features and select locations for further imaging by viewing the composite image, which shows the spatial context of all features across different magnifications and detector settings. This eliminates the need to manually browse through multiple separate images, dramatically reducing analysis time while maintaining thoroughness through the comprehensive view provided by the composite image.

Inventive Principle:
Principle #5Merging (Combining)

Data Source

PatentUS8426812B2Microscope system, method for operating a charged-particle microscope
Publication Date: 2013.04.23 CARL ZEISS NTS LTD
  • US8426812B2 patent drawing
  • US8426812B2 patent drawing
  • US8426812B2 patent drawing

AI summary

A method of operating a charged-particle microscope, the method comprising: recording a first image of a first region of an object in a first setting; recording a second image of a second region of the object using the charged-particle microscope in a second setting; reading a third image of a third region using the charged-particle microscope, wherein the first and second regions are contained at least partially within the third region; displaying a representation of the first image at least partly within the displayed third image, wherein the representation of the first image includes a first indicator which is indicative of the first setting; displaying a representation of the second image at least partly within the displayed third image, wherein the representation of the second image includes a second indicator which is indicative of the second setting, and wherein the displayed second indicator is different from the displayed first indicator.