Microscope Control Device for Phase Contrast Distortion Correction
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Solution Overview
Problem
The existing methods for correcting optical distortion in microscope images require significant computational resources due to the need for pixel-level distortion estimation and correction, which is inefficient in a phase contrast optical system.
Innovation Solution
A microscope control device and method that corrects phase contrast information using offset processing to account for optical distortions unique to the microscope, reducing the computational load by performing an offset process on phase contrast images and calculating defocus amounts based on corrected information.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If a distortion correction process is performed by estimating distortion amount at each pixel position for all pixels forming the image, then the distortion correction accuracy is improved, but a very large amount of calculation and resources is necessary
Solution Approach 1:
The patent divides the image into multiple blocks and performs distortion correction independently for each block rather than for the entire image at once. This segmentation reduces the computational complexity from O(N) where N is the total number of pixels, to O(N/B) where B is the number of blocks, significantly improving calculation efficiency while maintaining correction accuracy within each block
Solution Approach 2:
The patent performs preliminary actions by capturing a reference image of a lattice pattern before actual sample imaging. The distortion characteristics are measured and stored in advance, creating a distortion correction map that can be applied to subsequent images without repeating the complex measurement process, thus reducing real-time calculation loads
2Manufacturing precision
If a distortion correction process is performed for each pixel, then the distortion correction precision is improved, but the calculation time and resource consumption increase significantly
Solution Approach 1:
The patent segments the image processing into block-level operations where distortion parameters are calculated for each block rather than individually for each pixel. This reduces calculation time from proportional to total pixel count to proportional to block count, achieving a balance between precision and speed
Solution Approach 2:
The patent creates a distortion correction map from a reference lattice pattern image and applies this copied correction data to actual sample images. This allows the complex distortion measurement to be performed once and reused multiple times, significantly reducing repeated calculation time while maintaining correction precision
Data Source
AI summary
A microscope control device includes an offset processing unit that corrects phase contrast information regarding a phase contrast between corresponding phase contrast images, which is generated based on a set of the phase contrast images of a sample which are captured by a microscope, based on offset information of phase contrasts caused by optical distortions unique to the microscope, and a defocus amount calculation unit that calculates a defocus amount of the sample on the basis of the phase contrast information after offset correction.