Microscope Delay Control via Programmable Integrated Circuit

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Solution Overview

Problem

Existing microscopes using pulsed laser light face challenges in synchronizing excitation pulses and response detection due to component delays, requiring precise timing of control signals which is technically expensive and inflexible.

Innovation Solution

A microscope equipped with a programmable integrated circuit that includes delay elements, allowing for precise control of laser light sources and detectors through software-programmable delay settings, eliminating the need for additional hardware and enabling flexible delay adjustments from sub-nanosecond to several seconds.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If signal lines of different lengths or electronic delay elements are used to delay control signals, then precise timing synchronization is achieved, but device complexity and technical expenses increase

Engineering Contradiction:
Improvetiming precisionVSAvoidsystem complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The programmable integrated circuit serves multiple functions: it generates control signals, introduces precise delays, and synchronizes the laser light source and detector. This multi-functional approach replaces what would otherwise require separate delay elements and complex wiring, reducing overall system complexity while maintaining precise timing control

Inventive Principle:
Principle #6Universality (Multi-functionality)

Solution Approach 2:

The delay time is made programmable and adjustable through software control rather than being fixed by physical line lengths or hardware delay element settings. This allows flexible modification of delay parameters without changing the physical system structure, achieving precise timing control while simplifying the device architecture

Inventive Principle:
Principle #35Parameter changes

2Measurement precision

If fixed-length signal lines are installed to achieve precise delays, then timing accuracy is improved, but adaptability to system changes deteriorates

Engineering Contradiction:
Improvedelay precisionVSAvoidsystem adaptability
Core Design Contradiction:
Measurement precisionVSAdaptability or versatility

Solution Approach 1:

The delay time is transformed from a static fixed value determined by physical line lengths into a dynamic programmable parameter. The programmable integrated circuit allows delay values to be changed through software, enabling the system to adapt to different measurement requirements and system configurations while maintaining precise timing control

Inventive Principle:
Principle #15Dynamics

Solution Approach 2:

Instead of physically modifying signal line lengths to change delay times, the system uses a programmable representation of delay values stored in memory. This virtual copy of the delay parameter can be modified without any physical changes to the hardware, providing full adaptability while preserving timing precision

Inventive Principle:
Principle #26Copying

3Loss of time

If electronic delay elements are used for picosecond-range delays, then temporal resolution is improved, but device complexity and cost increase

Engineering Contradiction:
Improvetemporal resolutionVSAvoidcircuit complexity
Core Design Contradiction:
Loss of timeVSDevice complexity

Solution Approach 1:

The delay functionality is merged with the control signal generation function within a single programmable integrated circuit. This integration eliminates the need for separate electronic delay elements and reduces circuit complexity while achieving picosecond-range temporal resolution through coordinated control of the laser and detector

Inventive Principle:
Principle #5Merging (Combining)

Data Source

PatentUS8735790B2Method for examining an object using a microscope with delayed control signals and a microscope for examining an object
Publication Date: 2014.05.27 LEICA MICROSYSTEMS CMS GMBH
  • US8735790B2 patent drawing
  • US8735790B2 patent drawing
  • US8735790B2 patent drawing

AI summary

A microscope for examining an object includes a laser light source generating pulsed light so as to illuminate the object. A measuring system including a detector is adapted to detect detection light coming from the object and the measuring system generates a measurement signal based on the detection light. The microscope includes a programmable integrated circuit including a control element and at least one of a first delay element and a second delay element. The control element is configured to generate a first control signal adapted to control the detector and the measuring system. The control element is further configured to generate a second control signal adapted to control the laser light source. The first and second delay elements are configured to delay the first and second control signals, respectively.