Microscope Denoising Model Training for Low-Exposure Imaging

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Solution Overview

Problem

Conventional microscopy image denoising techniques are not specific to the hardware or sample, leading to suboptimal noise reduction and quality trade-offs in fluorescence imaging, particularly in high-throughput screening.

Innovation Solution

A tailored denoising model for microscopes is trained using a combination of hardware-specific and sample-specific training images, employing machine-learning models like U-Nets and generative adversarial networks, to accurately adapt to the microscope's hardware and sample noise characteristics.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Object-affected harmful factors

If exposure time or gain is reduced to minimize photobleaching and phototoxicity, then light exposure and sample damage are reduced, but image quality deteriorates due to increased noise

Engineering Contradiction:
Improvephotobleaching and phototoxicityVSAvoidimage quality
Core Design Contradiction:
Object-affected harmful factorsVSManufacturing precision

Solution Approach 1:

A denoising model is trained in advance using training images acquired at different exposure times and gains. This pre-trained model is then applied during actual imaging to restore image quality without requiring additional light exposure, thus resolving the contradiction between minimizing photodamage and maintaining image quality.

Inventive Principle:
Principle #10Preliminary action

Solution Approach 2:

The system creates a computational copy of the noisy low-exposure image and processes it through a denoising model to generate a restored image. This allows the original low-exposure image to remain intact while producing a high-quality version through computational processing.

Inventive Principle:
Principle #26Copying

2Ease of manufacture

If generic denoisers are used in cameras or postprocessing, then implementation is simple, but denoising effectiveness is limited due to lack of hardware and sample specificity

Engineering Contradiction:
Improveimplementation simplicityVSAvoiddenoising effectiveness
Core Design Contradiction:
Ease of manufactureVSMeasurement precision

Solution Approach 1:

Instead of using a universal denoising algorithm, the system trains a specialized denoising model for each specific microscope hardware configuration and sample type combination. This localized approach tailors the denoising characteristics to match the specific noise patterns of each hardware-sample pair, significantly improving denoising effectiveness while maintaining ease of use through automated training procedures.

Inventive Principle:
Principle #3Local quality

3Manufacturing precision

If image denoising is performed to restore quality, then image quality improves, but processing time and computational resources increase

Engineering Contradiction:
Improveimage qualityVSAvoidprocessing time
Core Design Contradiction:
Manufacturing precisionVSLoss of time

Solution Approach 1:

The denoising model is trained in advance during a preprocessing phase. Once trained, the model can rapidly process images during actual experiments without requiring extensive processing time. This separates the computationally intensive training phase from the rapid inference phase, resolving the time-quality tradeoff.

Inventive Principle:
Principle #10Preliminary action

Data Source

PatentEP4174758B1Training a denoising model for a microscope
Publication Date: 2025.08.20 LEICA MICROSYSTEMS CMS GMBH
  • EP4174758B1 patent drawingFigure 1
  • EP4174758B1 patent drawingFigure 2
  • EP4174758B1 patent drawingFigure 3

AI summary

The invention concerns a computer-implemented method (100) for training a denoising model (102) for a microscope (104). In one embodiment, the method comprises obtaining (106) a plurality of training images with different image acquisition settings taken with the microscope (104), the plurality of training images comprising noise caused by the microscope's hardware, and training (108) the denoising model (102) using the plurality of training images obtained with different image acquisition settings, thereby making the denoising model (102) specific to the microscope's hardware.