Microscope Focus Monitoring via Angled Auxiliary Light Path
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Solution Overview
Problem
Existing microscope focus monitoring systems often interfere with the imaging process by using auxiliary light beams that either disturb the main imaging area or fail to accurately monitor the same focus state as the imaging light, leading to potential deterioration of imaging quality and misalignment.
Innovation Solution
An apparatus that couples an auxiliary light beam into the microscope at an angle outside the main imaging area, using a registration device to monitor position changes of the reflected beam without interfering with the main imaging path, allowing for simultaneous imaging and focus state monitoring without affecting the imaging quality.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If an auxiliary light beam is used to monitor focus state by impinging on the object in the main imaging area, then focus monitoring is achieved, but imaging quality deteriorates due to interference with the main imaging path
Solution Approach 1:
The patent divides the light path into separate segments: the auxiliary light beam for focus monitoring travels through a different spatial path than the main imaging light beam. The auxiliary beam is coupled into the microscope at an angle and reflects off a reference boundary surface (such as the objective lens interface or a dedicated reference surface) to reach the registration device, while the main imaging path remains undisturbed. This spatial segmentation eliminates interference between the two functions.
Solution Approach 2:
The focus monitoring function is extracted from the main imaging area by using a separate auxiliary light path that does not intersect with the object plane in the main imaging area. The auxiliary beam interacts with a reference boundary surface within the optical system rather than the object itself, separating the monitoring function from the imaging function and eliminating mutual interference.
2Measurement precision
If the auxiliary light beam is directed through the main imaging area to monitor focus, then focus state registration is enabled, but the imaging process is disturbed
Solution Approach 1:
The patent introduces a reference boundary surface as an intermediary element within the optical system. The auxiliary light beam reflects off this reference surface (such as the objective lens interface or a dedicated reference mirror) rather than directly off the object. This intermediary provides a stable, known reference point for focus monitoring that does not interfere with the imaging of the actual object, enabling simultaneous operation of both functions.
3Adaptability or versatility
If auxiliary light coupling is performed within the main beam path, then focus monitoring is achieved, but beam path interference occurs
Solution Approach 1:
The patent resolves beam path interference by transitioning from a one-dimensional linear beam path to a multi-dimensional spatial configuration. The auxiliary light beam is coupled into the microscope at an angle relative to the optical axis, creating a separate plane of operation. This angular/dimensional separation allows both the main imaging beam and auxiliary monitoring beam to coexist in the same optical system without interference, simplifying the overall beam path configuration while maintaining both functions.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables accurate and non-invasive monitoring of the focus state of a microscope, maintaining imaging quality by keeping the auxiliary light and its reflections outside the main imaging area, thus preventing interference and ensuring precise focus state registration.
Implementation Method 1
a part of the coupled auxiliary light beam reflected by a reference boundary surface in the microscope impinges on the registration device
Data Source
AI summary
An apparatus is provided for monitoring a focal state of a microscope having an object plane and a main imaging area. The apparatus has an auxiliary light source providing an auxiliary light beam and coupling the auxiliary light beam into the microscope in such a way that the coupled auxiliary light beam runs within a plane which is spanned outside of the main imaging area by a straight line running in the object plane and a normal to the object plane, and that the coupled auxiliary light beam is inclined at an angle to a normal to the object plane. A part of the coupled auxiliary light beam reflected by a reference boundary surface in the microscope impinges on a registration device in an area of incidence. The registration device registers position changes of the area of incidence on the registration device.