Microscope Focus Control for Seamless Virtual Slide Imaging
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Solution Overview
Problem
Conventional virtual slide generation devices often produce seams between magnified images due to focus errors caused by dust or unevenness, resulting in a non-sharp image of the sample.
Innovation Solution
A microscope apparatus that detects the focus position of the objective lens and adjusts the focus state based on detected changes, limiting adjustments to within the depth of focus to prevent seams between adjacent images, ensuring a clear and sharp virtual slide.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If automatic focusing is performed for each small region to acquire sharp magnified images, then image sharpness is improved, but seams are formed between adjacent magnified images when focal positions differ
Solution Approach 1:
The patent applies preliminary action by detecting the focus position before acquiring the magnified image of each small region. The focus position detection unit measures the actual focus position, and the control unit compares it with the reference focus position to determine the focus state adjustment needed before image acquisition, preventing seam formation in advance
Solution Approach 2:
The patent implements feedback by using the focus position detection unit to measure the actual focus position of each small region, comparing it with the reference focus position, and using this feedback information to control the focus state adjustment unit to adjust the focus state before acquiring the next magnified image, ensuring seamless virtual slide creation
2Manufacturing precision
If focus state is adjusted to match detected focus position, then seam formation is reduced, but image acquisition time increases due to additional detection and adjustment steps
Solution Approach 1:
The patent applies partial action by selectively adjusting the focus state only when necessary. The control unit compares the detected focus position with the reference focus position and only commands focus state adjustment when the difference exceeds a predetermined threshold, avoiding unnecessary adjustment operations and time consumption
3Manufacturing precision
If focus state adjustment is limited to predetermined threshold, then seam visibility is reduced, but focus accuracy decreases when large focus changes occur
Solution Approach 1:
The patent applies dynamics by making the focus state adjustment strategy adaptive. The control unit dynamically determines whether to limit focus state adjustment based on the detected focus position difference. When the difference is within the predetermined threshold, the focus state is adjusted to match the detected position for high accuracy. When the difference exceeds the threshold, the focus state adjustment is limited to prevent visible seams, accepting reduced accuracy in exchange for seamlessness
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The solution effectively reduces the number of seams between magnified images, resulting in a clear and sharp virtual slide, even when focus changes are caused by dust or other external factors, by adjusting the focus state within the depth of focus limits.
Implementation Method 1
a magnified image of each part of the sample is acquired by the magnified-image acquisition section through image acquisition of light collected via the objective lens
Data Source
Figure 1
Figure 2
Figure 3A~3B
AI summary
The number of seams between magnified images in a created virtual slide is reduced to make the virtual slide clear and sharp. Provided is a microscope apparatus 1 including an objective lens 3 that collects light from a sample on a slide A; a focus position detecting section 5 that detects a focus position of the objective lens 3 with respect to the sample; a focus state adjustment section 6 that adjusts a focus state with respect to the sample based on a detection result from the focus position detecting section 5; and a magnified-image acquisition section 4 that acquires a magnified image of each part of the sample, in which, if the focus position detected by the focus position detecting section 5 is changed by more than a predetermined threshold with respect to a focus state in which an adjacent magnified image was obtained, the focus state adjustment section 6 limits the adjustment in the focus state to the predetermined threshold or less.