Microscope Focus Adjustment Using Reflected Light Detection

Resolve Bottlenecks,
Find Innovative SolutionsGenerate Solutions

Solution Overview

Problem

Existing methods for adjusting the focus of optical systems, such as microscopes, and determining the refractive index of sample media are slow and require high illumination intensity or image recording, often relying on contrast in the object or illumination.

Innovation Solution

A method and device that focus measurement light in a sample space using an optical arrangement, detect the reflected light with a detector, and ascertain the working distance to adjust the focus without needing contrast, allowing for quick determination of the refractive index by varying parameters like distance or divergence of the measurement light.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Speed

If prior art methods are used to adjust focus or determine refractive index, then measurement can be performed, but the process is slow and requires high illumination intensity

Engineering Contradiction:

Improvefocus adjustment speedVSAvoidillumination intensity

Core Design Contradiction:

SpeedVSIllumination intensity

Solution Approach 1:

The invention extracts the essential measurement function by using only a reflector and detector to measure working distance, removing the need for complex image recording systems and high illumination intensity. The focus adjustment is achieved by directly measuring the working distance between the objective and reflector, rather than through complex image analysis.

Inventive Principle:

Principle #2Taking out (Extraction)

Solution Approach 2:

The invention replaces the optical-mechanical system (image recording, contrast analysis) with a simplified optical measurement system using a reflector and detector. The working distance is measured optically by detecting reflected light, eliminating the need for mechanical image recording and complex optical processing.

Inventive Principle:

Principle #28Mechanics substitution (Replace mechanical system)

2Productivity

If prior art methods are used to adjust focus or determine refractive index, then measurement can be performed, but image recording is required

Engineering Contradiction:

Improvemeasurement efficiencyVSAvoiddevice complexity

Core Design Contradiction:

ProductivityVSDevice complexity

Solution Approach 1:

The invention extracts only the essential measurement function by using a simple reflector and detector arrangement. The complex image recording system, cameras, and image processing requirements are completely removed, leaving only the essential optical path for working distance measurement.

Inventive Principle:

Principle #2Taking out (Extraction)

Solution Approach 2:

The reflector serves multiple functions: it provides the measurement surface, reflects light back to the detector, and defines the working distance measurement point. The system uses itself for measurement without requiring external imaging equipment or complex auxiliary systems.

Inventive Principle:

Principle #25Self-service

3Measurement precision

If prior art methods are used, then focus adjustment can be performed, but contrast in object or illumination is required

Engineering Contradiction:

Improvefocus measurement precisionVSAvoidoperation simplicity

Core Design Contradiction:

Measurement precisionVSEase of operation

Solution Approach 1:

The invention replaces complex optical contrast analysis with a simple optical distance measurement system. The detector measures the working distance directly by detecting reflected light from the reflector, eliminating the need for contrast in the object or illumination and simplifying the operation to straightforward distance measurement.

Inventive Principle:

Principle #28Mechanics substitution (Replace mechanical system)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

Enables fast and efficient focus adjustment and refractive index determination without the need for high illumination or image recording, using a device with an optical arrangement, reflector, and detector to measure and output working distances, facilitating precise imaging in microscopes.

Implementation Method 1

focusing measurement light in a sample space using an optical arrangement

Methodology Applied

Scientific EffectLight focusing: Focusing

Implementation Method 2

The measurement light is transmitted on a sample side of the optical arrangement through at least one optical medium

Methodology Applied

Scientific EffectLight transmission: Light

Implementation Method 3

The measurement light reflected by a reflector and transmitted through a further optical arrangement is detected

Methodology Applied

Scientific EffectLight reflection: Reflection

Implementation Method 4

detected using a detector arrangement

Methodology Applied

Scientific EffectLight detection: Photoelectric Effect

Data Source

PatentUS11561384B2Method and device for adjusting the focus or determining the refractive index of a sample medium, non-volatile computer-readable storage medium and microscope

Publication Date: 2023.01.24 LEICA MICROSYSTEMS CMS GMBH

AI summary

A method for adjusting a focus of an optical system includes focusing measurement light in a sample space using an optical arrangement. The measurement light is transmitted on a sample side of the optical arrangement through at least one optical medium. The measurement light reflected by a reflector and transmitted through a further optical arrangement is detected using a detector arrangement. A working distance between the optical arrangement and the reflector is ascertained based on the measurement light detected by the detector, wherein a focus of the measurement light lies on the reflector for the working distance.