Microscope-Guided Single-Point Sensing for Fluid Droplet Alignment

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Solution Overview

Problem

Existing single-point sensing systems face challenges in efficiently aligning and interrogating small volumes of fluid on a substrate due to imprecision and high consumption of fluid and substrate, particularly in limited sample scenarios, as they often require scanning or using arrays of sensors, which are costly and inefficient.

Innovation Solution

A system utilizing a microscope to precisely identify and align fluid droplets on a substrate with a single-point sensor, allowing for dense arrays of interrogation sites on a small substrate area, reducing fluid and substrate consumption by using a two-stage location identification process and automated alignment.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If scanning or arrays of sensors are used to align and interrogate fluid droplets, then coverage and detection capability are improved, but system cost and complexity increase

Engineering Contradiction:
Improvedetection capabilityVSAvoidsystem complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The patent introduces a microscope as an intermediary device to locate fluid droplets on the substrate. The microscope provides precise positioning information that guides the single-point sensor to the correct locations, eliminating the need for complex sensor arrays or scanning mechanisms while maintaining high detection precision.

Inventive Principle:
Principle #24Intermediary (Mediator)

2Ease of operation

If larger substrate area is used to accommodate fluid droplets, then droplet placement and interrogation are simplified, but fluid and substrate consumption increase

Engineering Contradiction:
Improvedroplet placementVSAvoidsubstrate consumption
Core Design Contradiction:
Ease of operationVSLoss of substance

Solution Approach 1:

The system performs preliminary localization of fluid droplets using the microscope before the single-point sensor interrogation begins. This preliminary action allows precise positioning of the sensor at each droplet location, enabling efficient interrogation on a small substrate area without requiring large substrate areas for simplified operation.

Inventive Principle:
Principle #10Preliminary action

3Device complexity

If traditional alignment methods are used, then system simplicity is maintained, but alignment precision and interrogation speed deteriorate

Engineering Contradiction:
Improvesystem simplicityVSAvoidalignment precision
Core Design Contradiction:
Device complexityVSMeasurement precision

Solution Approach 1:

The patent replaces mechanical alignment methods with an optical-based approach using a microscope to locate droplets and determine their precise positions. This substitution maintains relative system simplicity while dramatically improving alignment precision and enabling faster interrogation by eliminating manual or mechanical alignment procedures.

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

Data Source

PatentUS20240411121A1Single point sensing
Publication Date: 2024.12.12 HEWLETT PACKARD DEVELOPMENT COMPANY LP
  • US20240411121A1 patent drawing
  • US20240411121A1 patent drawing
  • US20240411121A1 patent drawing

AI summary

A single point sensing system may include a microscope having a field of view, a single-point sensor having a focal point, a stage to support a substance, an actuator to move at least one of the single-point sensor and the stage relative to one another, and in alignment controller. The alignment controller is to identify a location of the substance on the stage based upon signals from the microscope and output sensor alignment signals to the actuator to align the location of the substance on the stage with the focal point of the single-point sensor based upon the identified location of the substance.