Microscope Homography Mapping for Sample Carrier Height Compensation
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Solution Overview
Problem
Conventional microscopes face challenges in reliably identifying the measurement location on sample carriers, such as multi-well plates, due to the lack of helpful information about the sample stage position, leading to inefficient and error-prone documentation processes, especially when manual or semi-automated methods are used.
Innovation Solution
A method and microscope system that utilize a computing device and overview camera to determine a homography, which converts the overview image into a plan view image, allowing for the identification of the measurement location by accounting for the sample carrier's height, enabling accurate image coordinate determination independent of the sample carrier's height.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Ease of operation
If manual methods are used to document measurement location, then flexibility is maintained, but documentation effort increases and error rate rises
Solution Approach 1:
The system automatically determines measurement location information using the overview image and homography transformation without requiring manual intervention. The computing device processes the overview image, applies the homography matrix, and extracts location coordinates automatically, making the system self-sufficient in documenting measurement locations.
Solution Approach 2:
The patent replaces manual mechanical documentation methods with an automated computational system. Instead of manually counting columns and rows, the system uses image processing and mathematical transformation (homography) to automatically determine measurement location, substituting human effort with automated computational processes.
2Productivity
If automated solutions are used for high content screening, then productivity increases, but device complexity and cost increase
Solution Approach 1:
The system uses a single overview camera that serves multiple functions: it captures overview images for location determination and can potentially serve other documentation purposes. The computing device performs multiple tasks including image processing, homography application, and location extraction, making the system versatile without requiring separate specialized components for each function.
Solution Approach 2:
The patent introduces a computing device as an intermediary between the overview camera and the measurement documentation system. This intermediary processes the overview image, applies the homography transformation, and extracts location information, serving as a bridge that simplifies the overall system architecture while enabling automated functionality.
3Loss of information
If overview images are recorded to document measurement location, then visual reference is provided, but image coordinate determination becomes complex due to sample carrier height
Solution Approach 1:
The patent changes the parameter space by applying a homography transformation that maps coordinates from the overview image (affected by sample carrier height and viewing angle) to a standardized coordinate system. This parameter transformation eliminates the dependency on sample carrier height, making coordinate determination straightforward regardless of the physical dimensions of the sample carrier.
Solution Approach 2:
The patent addresses the three-dimensional challenge of sample carrier height by using a two-dimensional homography transformation. The homography matrix captures the perspective distortion caused by the viewing angle and sample height, allowing the system to accurately determine measurement location in the overview image without being directly affected by the third dimension (sample carrier height).
Data Source
AI summary
An overview image of a sample carrier is obtained in a method for ascertaining a measurement location of a microscope. A mapping or homography is determined, by means of which the overview image is perspectively convertible into a plan view image on the basis of a height of the sample carrier. The measurement location is identified, with the aid of the determined mapping/homography, in the overview image or in an output image derived therefrom.