Fluorescence Microscope Illumination Control After Objective Changes
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Solution Overview
Problem
In fluorescence microscopy, changing objective lenses or other components in the light path disrupts the constant illumination intensity required for sample imaging, necessitating time-consuming manual adjustments and limiting the potential of modern solid-state light sources.
Innovation Solution
A control system that automatically determines and adjusts the illumination intensity of the light source using a physical model based on pre-change data and optical characteristics, allowing for rapid convergence to a desired illumination setting, even after objective changes.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Illumination intensity
If manual adjustment of illumination intensity is performed after objective change, then constant illumination intensity at the sample is maintained, but time consumption and operational complexity increase
Solution Approach 1:
The control system automatically determines the required illumination intensity and adjusts the light source power without user intervention. The system uses a physical model to calculate the new illumination parameters based on the changed optical configuration, enabling self-adjustment after objective changes
Solution Approach 2:
The system detects changes in the light path (objective changes) and uses this information to automatically adjust the illumination intensity. The control system continuously monitors the optical configuration and makes real-time adjustments to maintain constant illumination at the sample
2Productivity
If automated control of illumination intensity is implemented, then time efficiency improves, but device complexity increases
Solution Approach 1:
The physical model of the light path is pre-established and stored in the control system. When an objective change is detected, the system immediately retrieves the relevant parameters from the pre-stored model and calculates the required illumination adjustment, enabling rapid automated response without complex real-time computations
Solution Approach 2:
The system changes the operational parameters of the light source (power intensity) based on pre-calculated values from the physical model. By focusing on adjusting a single key parameter (illumination power) rather than multiple parameters simultaneously, the automation remains relatively simple while achieving the desired effect
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This solution enables automated, efficient adjustment of illumination intensity, reducing the need for manual re-setting and leveraging the fine wavelength-specific adjustments of solid-state light sources, ensuring consistent imaging quality and minimizing energy consumption.
Implementation Method 1
a light source (120 k) for stimulating a fluorophore (130) in a sample (110) to emit fluorescence light
Data Source
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AI summary
The invention, essentially, relates to a control system (150) for automatedly determining an illumination intensity (Pk,) of a light source (120k) of a fluorescence microscope (100), the light source (120k) used for stimulating fluorophore (130) in a sample (110), and configured to vary the illumination intensity (Pk,), and the microscope (100) having a detector (140) for detecting an image intensity (B) of the sample (110), the control system (150) configured to: automatedly determining (304), after a change (302) in a light path (164, 168) a control value for he illumination intensity (Pk,) of the at least one light source (120k) in order to achieve a desired value of an inspection parameter (B) characterizing sample inspection, wherein determining (304) the control value for the illumination intensity (Pk,) of the at least one light source (120k) is based on a value of the illumination intensity (Pk,) that was set before the change (302) in the light path (164, 168), on a value of the inspection parameter (B) used before the change (302) in the light path, and on a physical model (M) of the light path (164, 168), the physical model mapping the illumination intensity (Pk,) of the at least one light source (120k) to the inspection parameter (B), taking into account imaging characteristics of optical components (124, 132, 160m, 160m+1) in the light path (164, 168), to a microscope system and corresponding methods.