Microscope Illumination Control via Spatial Light Modulation
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Solution Overview
Problem
Existing microscope systems have limited adjustment capabilities for the intensity distribution of illumination light, relying on predetermined aperture shapes that may not be optimal for observing test objects, making it difficult for observers to select the most suitable aperture shape for improved image quality.
Innovation Solution
A microscope system with a computer-connected optical microscope that includes an illuminating optical system, imaging optical system, and image sensor, which analyzes image features of the test object and compares them to sample objects to set optimal illumination conditions, using spatial light modulating devices to adjust the intensity distribution and wavelength of illumination light for enhanced observation.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Device complexity
If the shape of the aperture is determined to a certain extent, then the device complexity is reduced, but the adaptability for different test objects deteriorates
Solution Approach 1:
The patent applies dynamics by transforming the static aperture shape into a dynamic, adjustable illumination intensity distribution. The illuminating optical system can continuously adjust the intensity distribution pattern (e.g., from uniform to concentrated, or different aperture shapes) based on the test object characteristics, making the system adaptable without increasing physical complexity
Solution Approach 2:
The patent changes the parameter of illumination intensity distribution from fixed to variable. By adjusting intensity parameters across different regions of the aperture, the system can achieve multiple illumination patterns without physically changing the aperture structure, thus resolving the contradiction between simplicity and adaptability
2Adaptability or versatility
If the shape of the aperture is allowed to be arbitrarily selected, then the adaptability for different test objects is improved, but the ease of operation deteriorates
Solution Approach 1:
The patent implements self-service by enabling the microscope system to automatically determine the optimal illumination intensity distribution based on the test object characteristics. The system autonomously selects appropriate illumination patterns without requiring operator expertise in aperture selection, thus maintaining adaptability while greatly simplifying operation
Solution Approach 2:
The system uses feedback mechanisms where the observed image quality is evaluated and used to adjust the illumination intensity distribution. This automatic feedback loop allows the system to adapt to different test objects while eliminating the complexity of manual aperture shape selection for operators
3Ease of operation
If the intensity distribution of illumination light is adjusted by varying a circular aperture, then the ease of operation is maintained, but the adaptability for different observation requirements deteriorates
Solution Approach 1:
The patent transforms the static circular aperture into a dynamic illumination system that can vary intensity distribution patterns. The system can dynamically switch between different patterns (uniform illumination, concentrated illumination, annular illumination, etc.) while maintaining the simple circular aperture structure, thus achieving both ease of operation and adaptability
Data Source
AI summary
A microscope includes an illuminating optical system that illuminates the test object under predetermined illumination conditions, an imaging optical system that forms an image of the test object, and an image sensor that outputs an image signal. A computer includes an image analyzing unit that acquires an image feature amount of the test object on the basis of the image signal detected by the image sensor, a comparison unit that compares the image feature amount of the test object with image feature amounts of a plurality of sample test objects and specifies an image feature amount of a sample test object closest to the image feature amount of the test object, and a setting unit that sets illumination conditions of the illuminating optical system on the basis of an illumination state suitable for observation of a sample test object having the image feature amount specified by the comparison unit.