Microscope Illuminator Using Projected Pattern for 3D Imaging
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Solution Overview
Problem
Conventional microscopes provide only two-dimensional images, and existing methods for achieving three-dimensional imaging are either expensive, complex, or limited to samples with contrasting features, making it difficult to generate reliable and accurate 3-D images across all samples.
Innovation Solution
A compact and low-cost microscope illuminator using two light sources with a processor to create a 3-D optical image, capable of turning a conventional microscope into a 3-D optical microscope by projecting a pattern onto the focal plane and analyzing image contrast to generate depth profiles and color information.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If a confocal microscope is used to generate 3-D images with quantitative depth measurement, then measurement precision is improved, but device complexity and cost increase significantly
Solution Approach 1:
The patent uses a digital copy of the projected pattern captured by the camera to analyze depth information, rather than requiring complex optical path splitting and beam recombination as in confocal microscopes. The projected pattern serves as a reference that can be digitally compared with the captured image to extract depth data.
Solution Approach 2:
The patent replaces the mechanical and optical complexity of confocal systems with a computational approach. Instead of using physical beam splitters, pinholes, and scanning mechanisms, the system uses digital image processing and pattern recognition algorithms to extract depth information from captured images.
2Ease of manufacture
If Sieckmann's method of analyzing image stacks is used, then cost is reduced, but reliability deteriorates for samples with little or no contrast
Solution Approach 1:
The patent projects a known pattern onto the sample and uses changes in the apparent position and distortion of this pattern to determine depth information. This approach provides reliable depth measurement even for samples with low contrast, because the depth information is derived from the projected pattern itself rather than from sample features.
Solution Approach 2:
The projected pattern acts as an intermediary that mediates between the light source and the sample. By analyzing how this intermediate pattern is distorted by the sample's topography, the system can extract depth information without relying on the sample's intrinsic contrast.
3Measurement precision
If Morgan's optical range sensor is used to measure depth profile, then measurement capability is improved, but harmful factors increase due to light pattern interference with sample features
Solution Approach 1:
The patent separates the depth measurement function from the imaging function by using the projected pattern exclusively for depth measurement. The depth information is extracted from the pattern distortion, while the sample's true features can be imaged separately without the pattern overlay, thus eliminating the interference problem.
Solution Approach 2:
The system uses periodic projection of the pattern at different focus positions to systematically map the sample's depth profile. By projecting the pattern at multiple known z-positions and analyzing the focus condition, the system can accurately determine depth without continuous pattern interference.
4Ease of operation
If conventional microscope is used, then ease of operation is maintained, but functionality deteriorates by providing only 2-D images
Solution Approach 1:
The patent adds a multi-functional capability to the conventional microscope by incorporating a light source that can project patterns and a camera that can capture both standard images and depth information. This allows the single microscope system to perform both conventional 2-D imaging and 3-D depth measurement without requiring separate specialized equipment.
Solution Approach 2:
The patent merges the depth measurement function with the existing microscope imaging system. The projected pattern is integrated into the optical path along with the sample illumination, and the camera captures both the sample image and the pattern information simultaneously, combining multiple functions in a unified system.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables the creation of reliable and accurate 3-D images on samples with or without contrast, making it easy and cost-effective to convert conventional microscopes into 3-D imaging systems without the need for expensive hardware modifications.
Implementation Method 1
a first light source (101) forming a first light path to illuminate a sample (120)
Implementation Method 2
a second light source (102) forming a second light path to project a pattern onto a focal plane of an objective lens (105)
Implementation Method 3
project a pattern onto the focal plane of a microscope objective lens
Data Source
AI summary
A compact and low cost microscope illuminator capable of generating 3-D optical images includes a first light source and a second light source. The two light sources lead two optical paths: one to illuminate a sample and another to project a pattern onto the focal plane of a microscope objective lens. The two light sources are controlled by a processor and can be turned on and off rapidly. A 3-D optical microscope equipped with said microscope illuminator and a method of creating a 3-D image on said 3-D optical microscope are also described.