Microscope Overlapping Process Using Image-Based Position Search
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Solution Overview
Problem
Existing microscope systems face challenges in generating a wide-field-angle overlapped image without losing the stage position during the overlapping process, leading to incomplete observation of the sample, especially when using manual stages without electrically-driven or encoder-equipped stages.
Innovation Solution
A microscope system with a movable stage, a position detecting unit, an imaging unit, an image generating unit, a position searching unit, and a control unit that stops the overlapping process when position detection fails and resumes it only when a successful position search is performed, ensuring accurate alignment and generation of a wide-field-angle overlapped image.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If a virtual slide system with electrically-driven stage or encoder-equipped stage is used to generate wide-field-angle overlapped image, then the entire sample image can be ascertained simultaneously with current visual field, but the device complexity increases
Solution Approach 1:
The patent replaces the mechanical/electrical position detection system (encoder-equipped stage or electrically-driven stage) with an image-based position search system. The position searching unit detects stage position by analyzing the relationship between currently acquired image data and previously acquired image data, eliminating the need for complex mechanical position detection mechanisms while maintaining reliable position tracking throughout the overlapping process
Solution Approach 2:
The patent introduces image data as an intermediary to represent stage position information. Instead of directly measuring mechanical position, the system uses the spatial relationship between image features to infer stage position, allowing the overlapping process to continue reliably without complex position detection hardware
2Device complexity
If manual stage without position detection is used, then device complexity is reduced, but stage position is lost during overlapping process leading to incomplete observation
Solution Approach 1:
The patent implements a feedback mechanism where the position searching unit continuously analyzes the relationship between current and previous image data to determine stage position. This feedback loop allows the system to maintain reliable position tracking throughout the overlapping process using only a simple manual stage, as the position information is continuously updated and verified through image analysis
Solution Approach 2:
The system makes the image data itself serve the dual purpose of both the observation target and the position reference. By analyzing features within the image data, the system self-determines stage position without requiring external position detection mechanisms, allowing reliable overlapping with simple manual stage operation
Data Source
AI summary
Provided is a microscope system including: a stage on which a sample is placed and that is movable in a direction orthogonal to an observation optical axis; a detecting unit that detects a position of the stage; an imaging unit that acquires an image of the sample on the stage; an image generating unit that generates an overlapped image by overlapping the acquired image with the position of the stage; a searching unit that searches for a position of the acquired image in the generated overlapped image; and a control unit that performs control including causing the image generating unit to stop the overlapping process and causing the searching unit to execute the position search when detection by the detecting unit fails, and causing the image generating unit to resume the overlapping process starting from a search position of the searching unit when the search is successful.