Microscope Imaging Device Oblique Stage Movement

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Solution Overview

Problem

In microscope imaging systems with an inclined specimen mount face relative to the optical axis, achieving accurate focus adjustment is challenging due to differences in optical path length, especially with 3-CCD devices, which complicates the adjustment of the imaging element's angle.

Innovation Solution

A microscope imaging system with a stage mount face orthogonal to the optical axis, allowing the imaging element to be arranged simply and orthogonally, and a moving mechanism that moves the stage obliquely intersecting with the optical axis, enabling precise focus adjustment by coordinating the movement of the stage and objective lens along the optical axis.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Ease of operation

If the specimen mount face is inclined relative to the optical axis to enable stage movement, then the imaging area can be scanned, but the optical path length varies across the imaging target area making accurate focus adjustment difficult

Engineering Contradiction:
Improvestage movement capabilityVSAvoidfocus adjustment accuracy
Core Design Contradiction:
Ease of operationVSMeasurement precision

Solution Approach 1:

Instead of inclining the mount face to enable scanning, the patent inverts the approach by making the mount face orthogonal to the optical axis. The scanning function is achieved by moving the stage obliquely, while the imaging element is kept orthogonal to the optical axis, thus eliminating optical path length variations and enabling accurate focus adjustment.

Inventive Principle:
Principle #13The other way round (Inversion)

Solution Approach 2:

The patent introduces oblique movement of the stage as a new dimensional approach. By moving the stage in an oblique direction (intersecting the optical axis at an angle other than 90 degrees), the system achieves both scanning capability and consistent optical path length, resolving the contradiction between ease of operation and measurement precision.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

2Measurement precision

If the imaging element is arranged inclined relative to the optical axis to cancel optical path length difference, then focus adjustment becomes possible, but the arrangement becomes particularly difficult with 3-CCD devices having three light receiving surfaces

Engineering Contradiction:
Improvefocus adjustment capabilityVSAvoidimaging element arrangement complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

Instead of inclining the imaging element to compensate for optical path differences, the patent inverts the approach by keeping the imaging element orthogonal to the optical axis and eliminating the need for inclination by making the mount face orthogonal and using oblique stage movement. This greatly simplifies the arrangement, especially for 3-CCD devices.

Inventive Principle:
Principle #13The other way round (Inversion)

Solution Approach 2:

The patent extracts the inclination requirement from the imaging element arrangement. By removing the need to incline the imaging element through proper stage and mount face configuration, the system eliminates the complex alignment procedures required for multi-surface imaging devices like 3-CCD cameras.

Inventive Principle:
Principle #2Taking out (Extraction)

3Ease of manufacture

If the mount face is made orthogonal to the optical axis for simple imaging element arrangement, then the imaging element can be readily arranged orthogonally, but the stage must be moved obliquely to achieve both scanning and focus adjustment

Engineering Contradiction:
Improveimaging element arrangement easeVSAvoidstage movement complexity
Core Design Contradiction:
Ease of manufactureVSEase of operation

Solution Approach 1:

The patent employs dynamic stage movement in an oblique direction to achieve both scanning and focus adjustment functions. This dynamic approach allows the mount face to remain orthogonal for simple imaging element arrangement while the stage's oblique movement provides the necessary flexibility for both imaging and focusing operations.

Inventive Principle:
Principle #15Dynamics

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This configuration allows for easy arrangement of the imaging element and facilitates high-accuracy focus adjustment without complex angle adjustments, ensuring consistent optical path lengths and reducing the risk of vibration during focus adjustment.

Implementation Method 1

an imaging optical unit arranged between the stage and the imaging unit and having an objective lens for imaging light from a part of the imaging region onto the imaging unit

Methodology Applied
Scientific EffectLight refraction: Refraction

Data Source

PatentEP2866070B1Microscope imaging device, and microscope imaging method
Publication Date: 2023.08.09 HAMAMATSU PHOTONICS KK
  • EP2866070B1 patent drawingFigure 1
  • EP2866070B1 patent drawingFigure 2
  • EP2866070B1 patent drawingFigure 3~3(c)

AI summary

A microscope imaging system is provided as one allowing an imaging element to be readily arranged, while facilitating accurate focus adjustment. The microscope imaging system 1A is provided with: a stage 2 having a mount face 2b on which a specimen 3 is to be mounted; an imaging unit 6 having an imaging element 4 for imaging a part of an imaging region set on the mount face 2b; and a optical unit 8 arranged between the stage 2 and the imaging unit 6 and having an objective lens 7 for imaging light from a part of the imaging region onto the imaging unit 6. The specimen 2 is arranged so that the mount face 2b is orthogonal to an optical axis L of the objective lens 7. Since at least one of the stage 2 and the objective lens 7 is configured so as to be movable in a direction A1 obliquely intersecting with the optical axis L while the mount face 2b is kept orthogonal to the optical axis L, the focus can be adjusted on the specimen 3 with high accuracy, without need for execution of complicated angle adjustment for the imaging element 4.