Microscope Mask Switching for Refractive Index Measurement
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Solution Overview
Problem
Existing microscope systems face challenges in accurately calculating the refractive index of samples due to spherical aberrations, which affect the precision of optical systems and hinder effective measurement.
Innovation Solution
A confocal microscope apparatus with a switching unit that alters the cross-sectional shape of illumination and detection light paths using a mask or spatial light modulator, coupled with an arithmetic control unit to calculate the refractive index based on the movement of light condensing and image forming positions, allowing for precise refractive index determination.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If a correction apparatus is used to correct spherical aberration, then measurement precision is improved, but device complexity increases
Solution Approach 1:
The patent extracts the spherical aberration correction function from a separate correction apparatus and integrates it into the objective lens itself through a correction collar. This allows the objective lens to correct spherical aberration caused by cover glass thickness variations without requiring an additional independent correction device, thereby maintaining measurement precision while reducing overall device complexity.
Solution Approach 2:
The objective lens is designed with multi-functionality by incorporating a correction collar that enables it to perform both primary focusing and spherical aberration correction. This universal design allows a single optical component to handle multiple functions, eliminating the need for separate correction apparatus and reducing device complexity while maintaining measurement precision.
2Device complexity
If spherical aberration is not corrected, then device complexity is reduced, but measurement precision deteriorates
Solution Approach 1:
The correction collar is pre-adjusted to match the actual cover glass thickness before measurement. This preliminary action of setting the correction collar to the appropriate position compensates for spherical aberration in advance, ensuring that the optical system maintains measurement precision without requiring complex real-time correction mechanisms during the measurement process.
3Measurement precision
If the cross-sectional shape of light is changed using a switching unit, then measurement precision is improved, but ease of operation deteriorates
Solution Approach 1:
The system uses feedback by measuring the movement amount of the light condensing position or image forming position when the mask pattern is switched, and using this measurement to calculate the refractive index. This feedback mechanism automates the measurement process, reducing manual intervention and improving ease of operation while maintaining high measurement precision through accurate refractive index determination.
Data Source
AI summary
A microscope apparatus comprises: an illumination optical system that guides light from a light source to a sample; a detection unit that detects light from the sample; a detection optical system that has an objective lens and guides light from the sample to the detection unit; a mask that allows a portion of light from the sample and light from the light source to pass therethrough, and blocks the other portion; a mask-switching unit that changes mask patterns of the mask; a microscope control unit; and an information-processing device. The microscope control unit controls the mask-switching unit to change mask patterns. The information-processing device obtains information about the amount of movement of the focus position of the optical system including the objective lens when mask patterns are changed, and calculates the refractive index of the sample based on the obtained information about the amount of movement of the focus position.