Confocal Microscope Mask Switching for Precise Refractive Index Measurement
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Solution Overview
Problem
Existing methods for measuring the refractive index of a sample using a confocal microscope are limited by spherical aberrations, which affect the accuracy and precision of the measurement.
Innovation Solution
A microscope apparatus and method that utilizes a switching unit to change the cross-sectional shape of illumination and detection light, coupled with an arithmetic control unit to calculate the movement amount of light condensing and image forming positions, allowing for the correction of spherical aberrations and precise refractive index calculation.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If a correction apparatus is used to correct spherical aberration, then measurement precision is improved, but device complexity increases
Solution Approach 1:
The patent extracts the spherical aberration correction function from a separate correction apparatus and integrates it into the objective lens itself. The objective lens is designed with multiple lens elements, where at least one lens element has a specific refractive index and curvature radius relationship (n-1 > 0.05 and r < 0.5mm) to inherently correct spherical aberration. This eliminates the need for additional correction optics while maintaining measurement precision.
Solution Approach 2:
The patent combines the spherical aberration correction function with the objective lens structure. By integrating the correction capability directly into the objective lens through carefully designed lens elements with specific refractive indices and curvature radii, the system merges the imaging function and aberration correction function into a single optical component, reducing overall device complexity.
2Manufacturing precision
If multiple lens elements with specific refractive indices are used to correct spherical aberration, then manufacturing precision is improved, but ease of manufacture deteriorates
Solution Approach 1:
The patent applies local quality by specifying precise refractive index ranges (n-1 > 0.05) and curvature radius constraints (r < 0.5mm) for particular lens elements within the objective lens assembly. Rather than requiring all elements to meet stringent tolerances, only specific elements need to satisfy these local optical property requirements, making manufacturing more feasible while achieving spherical aberration correction.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The solution enables accurate and precise measurement of the refractive index by compensating for spherical aberrations, improving the reliability and accuracy of the measurement process.
Implementation Method 1
an illumination optical system which guides illumination light from a light source to a sample
Implementation Method 2
a detection optical system which guides the detection light from the sample to the detection unit
Implementation Method 3
a member which is provided in at least one of the illumination optical system and the detection optical system; a switching unit that changes at least one of a cross-sectional shape of the illumination light
Implementation Method 4
a switching unit that changes at least one of a cross-sectional shape of the illumination light in a plane which intersects with an optical axis
Data Source
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AI summary
A microscope apparatus (1) comprising: an illumination optical system (20) that guides light from a light source (17) to a sample (TP) ; a detection unit (51) that detects light from the sample (TP) ; a detection optical system (40) that has an objective lens (30) and guides light from the sample (TP) to the detection unit (51); a mask (27) that allows a portion of light from the sample (TP) and light from the light source (17) to pass therethrough, and blocks the other portion; a mask-switching unit (28) that changes mask patterns of the mask (27); a microscope control unit (80); and an information-processing device (90). The microscope control unit (80) controls the mask-switching unit (28) to change mask patterns. The information-processing device (90) obtains information about the amount of movement of the focus position of the optical system including the objective lens (30) when mask patterns are changed, and calculates the refractive index of the sample (TP) on the basis of the obtained information about the amount of movement of the focus position.