Microscope Oblique Illumination Incident Angle Control

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Solution Overview

Problem

Conventional microscopes that illuminate specimens from an oblique direction face challenges in acquiring satisfactory cross-sectional images of thick specimens due to difficulties in adjusting the incident angle of illumination light effectively.

Innovation Solution

A microscope system that includes an illumination optical system for oblique illumination, an observation optical system with an objective lens, and a controller that moves the stage and objective lens in the same direction as the optical axis, allowing for adjustment of the incident angle of illumination light based on imaging conditions to optimize image acquisition.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If the incident angle of illumination light is adjusted to improve cross-sectional image quality of thick specimens, then image clarity is improved, but the complexity of the microscope system increases

Engineering Contradiction:
Improveimage clarityVSAvoidsystem complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The controller automatically adjusts the incident angle of illumination light based on the position of the stage or objective lens, eliminating the need for manual intervention. The system serves itself by autonomously optimizing illumination conditions during observation, thereby improving image clarity without requiring complex manual adjustment mechanisms

Inventive Principle:
Principle #25Self-service

Solution Approach 2:

The incident angle of illumination light is dynamically changed as a controllable parameter based on the positional information of the stage or objective lens. By varying this optical parameter automatically, the system maintains optimal illumination conditions for different observation depths, improving cross-sectional image quality of thick specimens

Inventive Principle:
Principle #35Parameter changes

2Measurement precision

If the incident angle of illumination light is changed to improve overlap of illumination and visual fields, then image quality is improved, but the ease of operation deteriorates

Engineering Contradiction:
Improveoverlap of illumination and visual fieldsVSAvoidease of adjustment
Core Design Contradiction:
Measurement precisionVSEase of operation

Solution Approach 1:

The controller autonomously manages the incident angle adjustment based on positional feedback, eliminating the need for operator intervention. The system automatically optimizes the overlap between illumination and visual fields by changing illumination conditions in response to stage or objective lens position changes

Inventive Principle:
Principle #25Self-service

Solution Approach 2:

The system uses positional information of the stage or objective lens as feedback to automatically adjust the incident angle of illumination light. This closed-loop control ensures that the illumination field remains optimally aligned with the visual field across different observation depths, improving overlap without requiring manual coordination

Inventive Principle:
Principle #23Feedback

Data Source

PatentUS10823675B2Microscope, observation method, and a storage medium
Publication Date: 2020.11.03 NIKON CORP
  • US10823675B2 patent drawing
  • US10823675B2 patent drawing
  • US10823675B2 patent drawing

AI summary

A microscope, including: an illumination optical system that irradiates a specimen with illumination light from an oblique direction; an observation optical system including an objective lens; and a controller that moves at least one of a stage to hold the specimen and the objective lens in a same direction as an optical axis of the objective lens. The controller changes, when moving at least one of the stage and the objective lens, an incident angle of the illumination light with respect to the specimen.