Optical Microscope with Opposing Scan Directions
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Solution Overview
Problem
Current laser scanning microscopes face challenges in achieving high resolution with short measurement times while maintaining a good signal-to-noise ratio, due to the limited number of detected photons and the complexity of equipment required for data processing.
Innovation Solution
A light microscope design that incorporates a second scanning device for a detection scanning movement opposite to the illumination scanning movement, allowing detector elements to consistently receive light from the same sample area, reducing equipment requirements and processing time.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If a laser scanning microscope uses a pinhole spatial filter to achieve increased resolution, then resolution is improved, but the signal-to-noise ratio deteriorates due to the limited number of detected photons
Solution Approach 1:
The patent replaces the mechanical pinhole spatial filtering system with a computational approach. Instead of using a physical pinhole to filter light, the invention uses algorithmic processing of images acquired with a larger aperture (without pinhole) to achieve super-resolution while maintaining better signal-to-noise ratio. The computational method calculates super-resolution images by combining multiple images with different illuminations, effectively substituting mechanical filtering with information processing.
2Adaptability or versatility
If multiple optics assemblies are used to generate structured illumination light, then flexibility in illumination patterns is improved, but device complexity increases
Solution Approach 1:
The patent employs a single beam shaping unit that can generate multiple different structured illumination patterns (lines, grids, dots, etc.) through computational control rather than requiring separate optical assemblies for each pattern type. This multi-functional approach allows the same hardware to achieve various illumination configurations by modifying the illumination pattern data, thereby reducing device complexity while maintaining flexibility.
Solution Approach 2:
The invention changes the illumination pattern parameters (shape, orientation, spacing) through software control of the beam shaping unit rather than physically reconfiguring optical components. By varying parameters such as line spacing, grid dimensions, and pattern geometry in the computational domain, the system achieves multiple illumination configurations without adding optical assemblies.
3Measurement precision
If sequential image acquisition with different grating orientations is used, then increased resolution is achieved, but measurement time increases
Solution Approach 1:
The patent implements continuous scanning illumination that continuously illuminates and scans across the sample area rather than sequentially acquiring images with different gratings. The beam shaping unit continuously generates structured illumination patterns while scanning, allowing simultaneous data collection for multiple orientations and positions, thereby reducing total measurement time while maintaining super-resolution capability.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach enables high-resolution imaging with a good signal-to-noise ratio and reduced out-of-focus sample light without the need for complex calculations, achieving improved resolution and faster measurement times.
Implementation Method 1
at least one light source (10) for emitting illuminating light (15) towards a sample plane (40)
Implementation Method 2
a first scanning device (20) for deflecting a beam path of the illuminating light (15)
Implementation Method 3
a detector device (60) for detecting sample light (53) coming from the sample (41)
Implementation Method 4
Optics (21, 52) for imaging different sample areas onto different detector areas of the detector device (60)
Data Source
Figure 1
Figure 2
Figure 3~4
AI summary
The invention relates to an optical microscope having: a sample plane in which the sample to be examined can be positioned; a light source to project the illuminating light; optical imaging means to guide the illumination light into the sample plane; a first scan device with which a beam of the illumination light and the sample can be moved relative to one another to generate an illumination scanning movement of the illumination light relative to the sample; a detector device to pick up sample light coming from the sample; and electronic means for generating an image of the sample on the basis of the sample light picked up by the detector device for various sample regions. The optical microscope is characterized in that a second scan device is provided with which it is possible to adjust the sample region that can be imaged onto a specific detector element, to generate a detection scanning movement of a reception region of a detector element in the sample plane relative to the sample, and is further characterized in that the electronic means is equipped to control the first and the second scan devices dependently of each other and in such a manner that an instantaneous direction of the detection scanning movement is opposite to an instantaneous direction of the illumination scanning movement. The invention also relates to a corresponding microscopy method.