Microscope Overview Image Generation Using Adaptive Illumination
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Solution Overview
Problem
Users of microscopes face difficulties in positioning samples within the observation volume due to small object fields and low depths of field at high magnifications, making it challenging to generate reliable overview images for navigation.
Innovation Solution
A method involving the use of an overview camera with adjustable illumination, including reflected and transmitted light, and machine learning for determining optimal illumination based on sample carriers, combined with a calibration plate for correcting optical distortions, allows for the generation of reliable overview images that can be used to navigate and position samples accurately.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If high magnification objectives are used to examine samples, then measurement precision is improved, but the object field and depth of field become too small for reliable sample positioning
Solution Approach 1:
The patent divides the overview image generation into multiple segments by using multiple low-magnification objectives to capture different regions of the sample carrier. These segmented images are then stitched together to form a complete overview, allowing high-precision positioning while maintaining a large field of view.
Solution Approach 2:
The patent creates a virtual copy of the sample carrier at low magnification using the overview camera, which captures a large field of view. This copy serves as a navigation guide, allowing users to locate samples without needing to directly observe them at high magnification, thus resolving the contradiction between field size and positioning precision.
2Area of stationary object
If multiple low-magnification images are stitched together to create overview images, then the object field area is increased, but the complexity of image processing increases
Solution Approach 1:
The patent implements self-service by having the system automatically detect sample carrier features, determine optimal illumination settings, and stitch images without requiring manual user intervention. The microscope system autonomously manages the complex image processing tasks, reducing the operational complexity burden on the user.
Solution Approach 2:
The patent changes key parameters including illumination intensity, camera exposure settings, and objective lens selection dynamically during the overview image generation process. By optimizing these parameters automatically, the system reduces processing complexity while maintaining high image quality across the extended field of view.
3Adaptability or versatility
If different illumination types are used for different sample carriers, then adaptability is improved, but device complexity increases
Solution Approach 1:
The patent implements dynamics by making the illumination system adjustable and adaptable. The microscope can dynamically switch between different illumination types (transmitted light, reflected light, dark field) based on the detected sample carrier type and imaging requirements. This dynamic configuration allows high adaptability while managing complexity through automated control.
Solution Approach 2:
The patent changes illumination parameters such as light source type, intensity, and angle based on the sample carrier characteristics. By automatically adjusting these parameters, the system achieves versatility across different sample types without requiring complex manual reconfiguration, thus managing device complexity while improving adaptability.
4Productivity
If overview images are generated quickly for navigation, then productivity is improved, but image quality may deteriorate
Solution Approach 1:
The patent applies preliminary action by capturing multiple low-magnification images of the sample carrier at different positions and illumination settings before final overview image generation. This preliminary data collection enables rapid stitching and navigation while maintaining high image quality, as the foundation images are already optimized for both speed and quality requirements.
Solution Approach 2:
The patent ensures continuity of useful action by maintaining consistent illumination settings and camera parameters throughout the image capture sequence. This continuous optimization of imaging parameters allows rapid overview generation without compromising quality, as the same reliable settings are applied across all captured images.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This method enables the creation of reliable overview images that improve sample carrier recognition and positioning, allowing for efficient navigation and analysis with high magnification, even for diverse sample types like multiwell plates, by utilizing a combination of reflected and transmitted light illuminations and machine learning, and correcting optical distortions using calibration data.
Implementation Method 1
the sample carrier is illuminated by a first illumination, wherein a preliminary overview image is generated using the first illumination and an overview camera of the microscope
Implementation Method 2
The first illumination can be a reflected light illumination or a transmitted light illumination
Data Source
AI summary
A method for generating an overview image of a sample which is arranged in an observation volume of a microscope by means of a sample carrier is proposed, wherein the sample carrier is illuminated by a first illumination, wherein a preliminary overview image is generated using the first illumination and an overview camera of the microscope, wherein an overview image illumination is chosen on the basis of the preliminary overview image, wherein the sample carrier is illuminated by the overview illumination, and wherein the overview image is generated using the overview image illumination and the overview camera.