Super-Resolution Microscope Phase Retrieval via Phasorgrams

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Solution Overview

Problem

Current technologies can only measure amplitude distribution, losing approximately 80% of information, as phase information is not directly measurable in the diffraction plane, making it challenging to reconstruct the complete wave front in both the output and diffraction planes.

Innovation Solution

A novel method using phasorgrams and an iterative algorithm to infer the phase distribution from amplitude data, eliminating the need for data from two Fourier conjugate planes, and employing perturbing devices like kinoform lenses to generate additional information for phase retrieval.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Ease of operation

If amplitude distribution measurement is used in the diffraction plane, then measurement simplicity is improved, but information completeness deteriorates (80% information loss due to unmeasurable phase)

Engineering Contradiction:
Improvemeasurement simplicityVSAvoidphase information loss
Core Design Contradiction:
Ease of operationVSLoss of information

Solution Approach 1:

The patent introduces phase filters as intermediary elements placed in the output plane to modulate the wavefront phase. By measuring amplitude distributions with different known phase filters and using these as mediators to infer the unknown phase distribution through iterative algorithms, the system recovers phase information without directly measuring it, thus resolving the contradiction between measurement simplicity and information completeness

Inventive Principle:
Principle #24Intermediary (Mediator)

Solution Approach 2:

The patent employs iterative error reduction algorithms that use feedback loops to progressively refine phase estimates. The algorithm repeatedly compares calculated amplitude distributions with measured ones, adjusts phase estimates based on the error, and converges to the correct phase distribution, enabling complete wavefront reconstruction from amplitude-only measurements

Inventive Principle:
Principle #23Feedback

2Measurement precision

If Gerchberg-Saxton algorithm is used with two Fourier conjugate planes, then phase retrieval capability is improved, but device complexity increases (requiring access to both output and diffraction planes)

Engineering Contradiction:
Improvephase retrieval capabilityVSAvoidmeasurement system complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The patent extracts and removes the requirement for accessing the diffraction plane by developing methods that work with amplitude measurements taken solely in the output plane. By taking out the diffraction plane requirement and replacing it with phase filter measurements in the output plane, the system achieves phase retrieval with reduced device complexity while maintaining measurement precision

Inventive Principle:
Principle #2Taking out (Extraction)

Solution Approach 2:

The patent segments the phase retrieval process into multiple iterative steps using different phase filters. Instead of requiring simultaneous access to both conjugate planes, the method segments the problem into sequential measurements with different known phase modulations, each contributing to the final phase reconstruction through the iterative algorithm

Inventive Principle:
Principle #1Segmentation

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The method consistently and accurately retrieves the phase distribution, achieving phase retrieval with a significant reduction in error, demonstrating its potential for applications like X-ray crystallography and improving phase retrieval in various wavefront analysis scenarios.

Implementation Method 1

the Rayleigh-Sommerfeld scalar wave diffraction equation

Methodology Applied
Scientific EffectDiffraction: Diffraction

Implementation Method 2

the scattered wave front propagating from output to diffraction plane along the Z axis

Methodology Applied
Scientific EffectWave propagation:

Implementation Method 3

a detector located at position Zd along the Z-axis

Methodology Applied
Scientific EffectPhotoelectric detection: Photoelectric Effect

Data Source

PatentUS8941914B2Light microscope with novel digital method to achieve super-resolution
Publication Date: 2015.01.27 WAVEFRONT ANALYSIS
  • US8941914B2 patent drawing
  • US8941914B2 patent drawing
  • US8941914B2 patent drawing

AI summary

Methods and apparatus for reconstructing a wave, including interpolation and extrapolation of the phase and amplitude distributions, with application to imaging apparatus, such as microscopes.