Wide-Field Microscope Using Pinhole Aperture for Super-Magnification
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Solution Overview
Problem
Conventional optical microscopes are limited by the Abbe limit, which restricts their resolution and magnification capabilities, unable to produce wide-field images beyond this limit without scanning, which is inefficient.
Innovation Solution
A wide-field optical microscope design featuring a primary and secondary optical element configuration where the sample is positioned closer to the primary element than its focal length, collimating light, and using a pinhole aperture and negative optical elements to block non-focused light and achieve high magnification and resolution.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If conventional optical microscopy is used, then the microscope can produce wide-field images, but the resolution is limited by the Abbe limit (about 200 nm)
Solution Approach 1:
The invention segments the optical path into distinct functional zones: a first optical element for collecting light, a pinhole aperture for spatial filtering, and a second optical element for magnification. This segmentation allows each component to be optimized independently, enabling super-magnification without being constrained by the conventional Abbe limit that applies to traditional single-lens systems.
Solution Approach 2:
The pinhole aperture acts as an intermediary element between the first and second optical elements. It serves as a spatial filter that blocks non-focused light while allowing focused light to pass through, thereby enabling the system to achieve super-magnification and enhanced resolution by eliminating optical aberrations and diffraction effects that would otherwise limit performance.
2Measurement precision
If laser scanning confocal microscopy is used to increase resolution beyond the Abbe limit, then resolution improves, but the image must be constructed by scanning point by point rather than producing a wide-field image
Solution Approach 1:
The invention merges the resolution-enhancing capabilities of confocal microscopy with the wide-field imaging capability of conventional microscopes. By combining the pinhole aperture (which provides optical sectioning and resolution enhancement) with a two-stage magnification system, the invention achieves both super-resolution and wide-field imaging simultaneously, eliminating the need for point-by-point scanning while maintaining high resolution.
Solution Approach 2:
The microscope system performs multiple functions simultaneously: it provides wide-field imaging, achieves super-magnification beyond the Abbe limit, and maintains high resolution without requiring scanning. The pinhole aperture serves multiple purposes including spatial filtering, optical sectioning, and aberration correction, making the system universally applicable for high-resolution wide-field imaging.
3Measurement precision
If the sample is positioned at the focal length of the primary element, then focused light is achieved, but non-focused light cannot be blocked to achieve super-magnification
Solution Approach 1:
The system performs preliminary focusing action at the pinhole aperture location, where light from the sample is focused before reaching the aperture. This preliminary focusing allows the pinhole to effectively filter non-focused light while maintaining the optical path configuration needed for super-magnification. The sample is positioned within the focal length of the first optical element, creating a virtual image that is then magnified by the second optical element.
Solution Approach 2:
The invention transitions from conventional two-dimensional imaging to a three-dimensional optical path configuration by introducing the pinhole aperture as a spatial filtering element in the optical path. This additional dimensional element allows selective blocking of non-focused light while maintaining focus on the sample plane, enabling super-magnification without increasing overall system complexity.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables resolution down to 0.1 Å with a magnification range exceeding 250 million power, surpassing the Abbe limit and providing a wide-field image without scanning.
Implementation Method 1
The primary element collects and collimates light reflected from the sample
Implementation Method 2
The secondary element then focuses the collimated light onto a pinhole aperture, which blocks all light rays that were not parallel, thus producing a non-focused reflected pattern
Implementation Method 3
The non-focused reflected pattern passes through a field stop and is then magnified by one or more negative optical elements
Data Source
AI summary
A wide-field optical microscope and method capable of resolving images down to 0.1 {acute over (Å)} with a magnification range in excess of 250 million power includes an objective having a primary and a secondary element. A sample is held so that the area of interest is at a location that is closer to the primary element than the focal length of the primary element. The primary element collects and collimates light reflected from the sample. The secondary element then focuses the collimated light onto a pinhole aperture, which blocks all light rays that were not parallel, thus producing a non-focused reflected pattern. The non-focused reflected pattern passes through a field stop and is then magnified by one or more negative optical elements and additional field stops to produce an enlarged pattern.