Microscope Sample Platform Follower for Precise Auto Focusing

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Solution Overview

Problem

Existing microscopic imaging systems face challenges with manual focusing being laborious and imprecise, while automatic focusing requires complex structures and is costly, and micromanipulation is time-consuming and laborious, necessitating on-site operation.

Innovation Solution

A microscopic imaging system with a sample platform, follower structure, and adjustable imaging device components that enable precise focusing and clear imaging through a combination of mechanical and electronic controls, allowing for automated adjustment of the imaging device's position relative to the sample.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Ease of manufacture

If manual focusing is used, then cost is reduced, but imaging precision and stability deteriorate

Engineering Contradiction:
ImprovecostVSAvoidimaging precision
Core Design Contradiction:
Ease of manufactureVSMeasurement precision

Solution Approach 1:

The system employs a follower structure that automatically tracks and follows the movement of the sample platform, enabling the imaging device to self-adjust its position without manual intervention. This self-service mechanism maintains precise focusing while reducing operational complexity and cost compared to complex automatic focusing systems.

Inventive Principle:
Principle #25Self-service

Solution Approach 2:

The patent replaces complex mechanical focusing mechanisms with a simpler follower structure that uses gravitational force and mechanical guidance. The imaging device follows the sample platform's movement through a follower arm mechanism, substituting complex active mechanical focusing with passive mechanical following, thereby reducing cost while maintaining precision.

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

2Measurement precision

If automatic focusing is used, then imaging precision is improved, but device complexity and cost increase

Engineering Contradiction:
Improveimaging precisionVSAvoidstructure complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The patent extracts the focusing function from complex automatic focusing systems and integrates it into the sample platform movement mechanism itself. The follower structure takes out the essential focusing action and performs it through the sample platform's own movement, eliminating the need for separate complex focusing mechanisms.

Inventive Principle:
Principle #2Taking out (Extraction)

Solution Approach 2:

The sample platform serves multiple functions: it carries the sample, provides movement control, and through the follower structure, enables automatic focusing. The follower structure multi-functionalizes the imaging device's positioning capability, allowing it to achieve precise focusing without dedicated complex focusing mechanisms.

Inventive Principle:
Principle #6Universality (Multi-functionality)

3Measurement precision

If micromanipulation is used, then positioning precision is improved, but operation time and labor increase

Engineering Contradiction:
Improvepositioning precisionVSAvoidoperation time
Core Design Contradiction:
Measurement precisionVSLoss of time

Solution Approach 1:

The follower structure enables the imaging device to automatically follow and track the sample platform's movement without requiring manual micromanipulation. The system self-adjusts its position based on the platform's movement, eliminating time-consuming manual operations while maintaining precise positioning.

Inventive Principle:
Principle #25Self-service

Solution Approach 2:

The follower structure is pre-configured to automatically track the sample platform's movement path. This preliminary setup eliminates the need for real-time manual micromanipulation during experimentation, reducing operation time while maintaining positioning precision through automated following.

Inventive Principle:
Principle #10Preliminary action

Data Source

PatentEP4321918B1Microscopic imaging systems
Publication Date: 2025.12.03 SHANGHAI RUIYU BIOTECH
  • EP4321918B1 patent drawingFigure 1
  • EP4321918B1 patent drawingFigure 2
  • EP4321918B1 patent drawingFigure 3

AI summary

The present disclosure provides a microscopic imaging system. The microimaging system includes a sample platform control structure and/or a platform mechanism for the microscopic imaging system. The sample platform control structure includes a base, an X platform, an X platform moving mechanism, a sample platform, a sample platform moving mechanism, a primary guide rail, and a secondary guide rail. The platform mechanism for the microscopic imaging system includes the sample platform control structure and a Y platform, a Y platform moving mechanism, a Z platform, a Z platform moving mechanism, and an imaging device.