Laser Scanning Microscope Polarization Compensation
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Solution Overview
Problem
High-resolution laser scanning microscopes often fail to achieve a zero residual fluorescence prevention light intensity in the focus, leading to reduced fluorescent light yield due to polarization changes caused by optical elements and sample substrates, which limits the intensity minimum and affects image resolution.
Innovation Solution
The method involves compensating for polarization changes in the fluorescence prevention light beam by adjusting or replacing optical elements in the beam path, using beam shaping means to adapt to the specific properties of lenses and sample substrates, ensuring the formation of an intensity minimum with minimal residual fluorescence prevention light intensity.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If the intensity of fluorescence prevention light in the intensity maxima is increased to drive fluorescence prevention to saturation, then the spatial resolution is improved, but the residual fluorescence prevention light intensity in the intensity minimum increases, reducing fluorescent light yield
Solution Approach 1:
The patent changes the polarization state of the fluorescence prevention light beam using beam shaping means (such as quarter-wave plates, half-wave plates, or liquid crystal devices) to modify the intensity distribution in the focal region. By adjusting polarization parameters, the system creates a more pronounced intensity minimum with reduced residual intensity while maintaining saturation at the maxima, thus resolving the contradiction between spatial resolution and fluorescent light yield
2Adaptability or versatility
If optical elements or sample substrates are introduced into the beam path, then the functionality of the microscope is enhanced, but polarization changes occur that increase residual fluorescence prevention light intensity in the intensity minimum
Solution Approach 1:
The patent implements a feedback mechanism where the system detects polarization changes introduced by optical elements or sample substrates and automatically compensates by adjusting the beam shaping means. The control unit monitors the polarization state and modifies the polarization parameters in real-time to maintain the desired intensity minimum, thus preserving fluorescent light yield while allowing enhanced microscope functionality
Solution Approach 2:
The patent applies preliminary anti-action by pre-compensating for polarization changes before they degrade performance. The beam shaping means is configured to counteract the expected polarization rotation or ellipticity that will be introduced by known optical elements or sample substrates, thereby preventing the increase in residual fluorescence prevention light intensity before it occurs
3Measurement precision
If beam shaping means are used to form an intensity minimum, then spatial resolution is improved, but the system becomes more complex requiring precise adjustment
Solution Approach 1:
The patent employs universal beam shaping means that can handle multiple polarization states and compensate for various types of polarization changes introduced by different optical elements and sample substrates. The beam shaping module is designed to work with different objective lenses and sample types without requiring complete reconfiguration, thus reducing system complexity while maintaining high spatial resolution through intensity minimum formation
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach allows for the achievement of a near-zero residual fluorescence prevention light intensity in the focus, enhancing the fluorescent light yield and improving the resolution of high-resolution laser scanning microscopy by effectively managing polarization changes.
Implementation Method 1
the beam shaping means shape a fluorescence prevention light beam directed into a rear aperture of a lens connected to the lens mount, at least with regard to its polarization
Implementation Method 2
compensating for polarization changes in the fluorescence prevention light beam by adjusting or replacing optical elements in the beam path
Data Source
Figure 1
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AI summary
In a high-resolution laser scanning microscope (1) with a lens connection (16) and beam shaping means (7) that shape a fluorescence-preventing light beam (3) directed into a back aperture of a lens (4) connected to the lens connection (16) at least with respect to its polarization, in order to form an intensity minimum bounded by intensity maxima in the focus (8) of the lens (4), several optical elements (4, 5, 11, 12) encompassing the lens (4) are arranged in the beam path of the fluorescence-preventing light beam (3) up to the focus (8) of the lens (4).The use of the laser scanning microscope (1) includes removing, replacing, adjusting, or adding one of the optical elements (4, 5, 11, 12) arranged in the beam path of the fluorescence prevention light beam (3) and compensating for any variation in polarization-changing properties of an assembly of optical elements (4, 5, 11, 12) arranged in the beam path of the fluorescence prevention light beam (3) resulting from the removal, replacement, adjusting, or adding of the one optical element (4, 5, 11, 12) by adjusting the beam shaping means (7).