Microscope Focus Positioning via Pattern Reflection Analysis
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Solution Overview
Problem
In microscopes, determining the precise distance between the sample carrier and the imaging optical system after sample insertion is challenging, especially in fully-automated image capture processes, as the initial distance is unknown, leading to difficulties in positioning the sample within the depth of field for clear imaging.
Innovation Solution
A detection unit with an illuminating module, a second detector, and a second imaging optical system is used to illuminate the sample carrier with a predetermined pattern, allowing the second detector to analyze the pattern's reflection to determine the focus position change along the optical axis, enabling the positioning of the sample carrier's boundary surface within the depth of field of the first imaging optical system.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If the distance between the sample carrier and the imaging optical system is unknown after sample insertion, then the sample cannot be positioned reliably in the depth of field area, but increasing the complexity of distance measurement systems would improve positioning accuracy
Solution Approach 1:
A detection unit with a second detector and illuminating module is introduced as an intermediary system to measure the distance between the imaging optical system and the sample carrier. This separate detection system uses a pattern projection method to determine the boundary surface position of the sample carrier, providing the necessary distance information without requiring complex direct measurement between the sample and imaging system.
Solution Approach 2:
The patent replaces complex mechanical distance measurement systems with an optical detection method. The detection unit projects a pattern onto the sample carrier boundary surface and analyzes the reflected light to determine position, substituting mechanical measurement with optical field-based measurement that is more precise and less complex.
2Ease of operation
If manual adjustment of the sample carrier position is used, then the operation is simple, but the positioning accuracy and automation level are low
Solution Approach 1:
The detection unit provides real-time feedback on the position of the sample carrier boundary surface by analyzing the reflected pattern. The control unit receives this feedback and automatically adjusts the sample carrier position or imaging system focus to achieve optimal positioning within the depth of field, creating a closed-loop automated system that maintains both ease of operation and high automation level.
Solution Approach 2:
The system performs self-positioning by automatically detecting the sample carrier boundary surface position and adjusting itself without requiring manual intervention. The detection unit and control unit work together to autonomously achieve accurate positioning, making the system self-sufficient while maintaining operational simplicity.
3Reliability
If the focus position is not corrected, then the imaging speed is fast, but the image quality and depth of field positioning are poor
Solution Approach 1:
The detection unit performs preliminary measurement of the sample carrier boundary surface position before the actual imaging process. This advance detection allows the control unit to pre-adjust the focus position or sample carrier location, ensuring that when imaging begins, the sample is already optimally positioned in the depth of field area, thus maintaining both high image quality and imaging speed.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This method allows for reliable and efficient positioning of the sample within the depth of field, enabling quick and accurate focus correction and stabilization, even when the sample is spaced apart from the boundary surface, by analyzing intensity changes and adapting focal position shifts dynamically.
Implementation Method 1
the illuminating module illuminates a sample carrier which is held by the holder with a predetermined pattern that is imaged by means of the second imaging optical system onto the second detector
Implementation Method 2
the second detector is masked in such a way that a detection area of the second detector which the pattern occupies during focused imaging, or a part of the detection area is defined as analysis area
Data Source
AI summary
A microscope is provided with a holder for holding a sample carrier, an imaging unit which comprises a first detector and a first imaging optical system for imaging at least one part of a sample held by the sample carrier along a first optical axis onto the first detector, a control unit and a detection unit which comprises an illuminating module, a second detector and a second imaging optical system. The control unit only analyzes the measured values originating from the analysis area by the second detector in order to determine the direction of the change of position of the focus of the first imaging optical system along the first optical axis with the aim of positioning the boundary surface of the sample carrier directed towards the sample side in the depth of field area of the first imaging optical system.