Microscope Sample Positioning Using Triangulating Autofocus
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Solution Overview
Problem
Existing microscopy systems with adjustable holders for various specimen carriers lack a fixed reference point, making manual positioning of samples cumbersome and error-prone, especially in closed systems with limited visual contact.
Innovation Solution
A method using a triangulating autofocus device to generate a measuring beam that reflects off a sample arrangement, generating height- and material-sensitive output signals to automatically determine boundary points and define sample areas by evaluating detector signals during displacement, combined with an xy-microscope stage for precise positioning.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Adaptability or versatility
If universal holders with adjustable frames are used to accommodate various specimen carriers, then adaptability is improved, but positioning precision deteriorates because the holder's adjustability eliminates a fixed reference point
Solution Approach 1:
The patent introduces a reference object with a known geometry and optically detectable features as an intermediary between the adjustable holder and the microscope system. This reference object serves as a mediator that provides fixed reference points (edges, corners, centers) that can be automatically detected, thereby resolving the positioning precision issue while maintaining the holder's adjustability and versatility
2Ease of operation
If manual positioning of specimen carriers is required due to lack of fixed reference points, then ease of operation deteriorates, but device complexity is reduced
Solution Approach 1:
The system performs self-positioning by automatically detecting the reference object's features and calculating the specimen carrier's position based on known geometric relationships. The microscope system serves itself by using its own imaging capabilities to detect reference features and compute positions, eliminating the need for manual intervention while adding minimal complexity through software algorithms
3Measurement precision
If visual verification by reviewing microscopic images is used for positioning, then measurement precision is improved, but productivity deteriorates due to time-consuming manual intervention
Solution Approach 1:
The patent replaces the manual visual verification process with an automated optical detection system. Instead of a user visually reviewing microscopic images to verify positioning, the system uses the microscope's imaging detector to automatically capture images of the reference object, process the images through algorithms, and determine positions without human intervention, thereby maintaining precision while dramatically improving productivity
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Automatically determines sample positions and defines working areas for microscopic examination, reducing manual intervention and errors, especially in systems with limited visual access.
Implementation Method 1
a measuring beam is generated by a measuring beam device of the microscope and directed onto the sample arrangement, and a measuring beam reflected from the sample arrangement is detected by a detector that generates an output signal
Data Source
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AI summary
The invention relates to a method for automatically determining a plurality of positions (P1-P8) in a sample arrangement (40) in the object space of a microscope (1) comprising a microscope objective (10) which defines an optical axis (8), wherein: a measurement beam (30) is generated by a measurement beam device (19) and directed at the sample arrangement (40), and a measurement beam (32, 32') reflected by the sample arrangement (40) is detected by a detector (28) which produces an output signal; the sample arrangement (40) is displaced in at least one direction perpendicular to the optical axis (8); and the plurality of positions (P1-P8) in the sample arrangement is determined on the basis of the displacement by means of output signals of the detector (28) generated during the displacement in the at least one direction. The invention also relates to a corresponding microscope (1).