Microscope Slide Height Measurement for Automated Focus Control
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Solution Overview
Problem
At high magnification, subtle height changes on the curved surface of a microscope slide cause image blurriness due to the small depth of field, leading to low efficiency in microscopic imaging and scanning, as manual adjustments are required for each sample, hindering scientific research and technology development.
Innovation Solution
A method for accurately measuring and calculating heights on the curved surface of a microscope slide by using a standard curved surface object to establish a functional equation, allowing for automatic adjustment of the microscope lens position to maintain clear imaging across multiple samples.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If manual adjustment of lens distance is performed for each sample, then clear imaging can be obtained, but imaging efficiency becomes very low
Solution Approach 1:
The patent measures and records the height information of the microscope slide surface in advance before imaging. This preliminary measurement allows the system to pre-calculate the appropriate lens distances for different regions, eliminating the need for manual adjustment during the imaging process and thereby大幅提高 imaging efficiency
Solution Approach 2:
The patent replaces manual mechanical adjustment of the lens with an automated control system that uses pre-measured height data to automatically adjust lens position. This substitution of mechanical manual operation with automated control based on measured data resolves the contradiction between imaging quality and efficiency
2Measurement precision
If high magnification is used, then imaging detail is improved, but depth of field becomes small causing image blurriness
Solution Approach 1:
The patent implements dynamic adjustment of the lens distance based on the measured height variations of the microscope slide surface. By making the lens position adaptable and variable rather than fixed, the system maintains optimal focus across different regions even at high magnification where depth of field is limited
Solution Approach 2:
The patent uses measured height information as feedback to automatically adjust lens position. This feedback mechanism ensures that the lens maintains the correct distance from the sample surface across regions with varying heights, preserving image clarity at high magnification
Data Source
AI summary
A method for measuring and calculating the height of a microscope slide and estimating the position of the microscope slide in a microscope system based on the height is provided so as to obtain a clear image under continuous scanning at high magnification. In the present invention, a standard microscope slide is used as a template to obtain heights of all standard measurement points on another microscope slide to be measured. The method is realized through a conversion relationship of a functional equation set of coordinates and the heights.